Measuring device and measuring method

The invention provides a measuring device and a measuring method for improving to-be-measured measuring precision of electronic components. The measuring device is provided with a current supplying part, a voltage detecting part and a processing part. The processing part measures multiple resistance...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NAGAI HIDEYUKI, TERASHIMA TAKAYUKI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a measuring device and a measuring method for improving to-be-measured measuring precision of electronic components. The measuring device is provided with a current supplying part, a voltage detecting part and a processing part. The processing part measures multiple resistances based on each current value of each measuring current which is supplied from each current supplying part through a first output terminal and a second output terminal and a voltage value which is detected by the voltage detecting part, and calculates a processing value which is obtained through performing numerical processing on each resistance as the resistance of a patch resistor, wherein the first output terminal is connected with two first supplying positions which are on a terminal arranged at one end of the body part of the patch resistor and are separated from each other in a second direction that is crossed with a first direction in connecting one end of the body part with the otherend. The second output t