Electronic assembly appearance detection device
The invention provides an electronic assembly appearance detection device. The device comprises an image acquisition module, an image processing module and an appearance quality judgment module, wherein the image acquisition module is used for acquiring an appearance image of an electronic assembly...
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| creator | SUN LEI CHEN LUNSEN XU HAICAI |
| description | The invention provides an electronic assembly appearance detection device. The device comprises an image acquisition module, an image processing module and an appearance quality judgment module, wherein the image acquisition module is used for acquiring an appearance image of an electronic assembly to be detected, the image processing module is used for processing the appearance image and acquiring electronic assembly outline information contained in the appearance image, and the appearance quality judgment module is used for comparing the outline information with standard outline informationand judging whether appearance quality of the electronic assembly to be detected is qualified. The appearance image of the electronic assembly to be detected is obtained for appearance quality detection, the problems of low speed and the high probability of false detection and missed detection caused by a manual detection mode in the prior art are solved, and production efficiency is greatly improved.
本发明提供一种电子元器件外观检测装置，包 |
| format | Patent |
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本发明提供一种电子元器件外观检测装置，包</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190628&DB=EPODOC&CC=CN&NR=109946308A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190628&DB=EPODOC&CC=CN&NR=109946308A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SUN LEI</creatorcontrib><creatorcontrib>CHEN LUNSEN</creatorcontrib><creatorcontrib>XU HAICAI</creatorcontrib><title>Electronic assembly appearance detection device</title><description>The invention provides an electronic assembly appearance detection device. The device comprises an image acquisition module, an image processing module and an appearance quality judgment module, wherein the image acquisition module is used for acquiring an appearance image of an electronic assembly to be detected, the image processing module is used for processing the appearance image and acquiring electronic assembly outline information contained in the appearance image, and the appearance quality judgment module is used for comparing the outline information with standard outline informationand judging whether appearance quality of the electronic assembly to be detected is qualified. The appearance image of the electronic assembly to be detected is obtained for appearance quality detection, the problems of low speed and the high probability of false detection and missed detection caused by a manual detection mode in the prior art are solved, and production efficiency is greatly improved.
本发明提供一种电子元器件外观检测装置，包</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB3zUlNLinKz8tMVkgsLk7NTcqpVEgsKEhNLErMS05VSEktAcpn5ucBWWWZyak8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_QwNLSxMzYwMLRmBg1AFUBK00</recordid><startdate>20190628</startdate><enddate>20190628</enddate><creator>SUN LEI</creator><creator>CHEN LUNSEN</creator><creator>XU HAICAI</creator><scope>EVB</scope></search><sort><creationdate>20190628</creationdate><title>Electronic assembly appearance detection device</title><author>SUN LEI ; CHEN LUNSEN ; XU HAICAI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN109946308A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SUN LEI</creatorcontrib><creatorcontrib>CHEN LUNSEN</creatorcontrib><creatorcontrib>XU HAICAI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SUN LEI</au><au>CHEN LUNSEN</au><au>XU HAICAI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electronic assembly appearance detection device</title><date>2019-06-28</date><risdate>2019</risdate><abstract>The invention provides an electronic assembly appearance detection device. The device comprises an image acquisition module, an image processing module and an appearance quality judgment module, wherein the image acquisition module is used for acquiring an appearance image of an electronic assembly to be detected, the image processing module is used for processing the appearance image and acquiring electronic assembly outline information contained in the appearance image, and the appearance quality judgment module is used for comparing the outline information with standard outline informationand judging whether appearance quality of the electronic assembly to be detected is qualified. The appearance image of the electronic assembly to be detected is obtained for appearance quality detection, the problems of low speed and the high probability of false detection and missed detection caused by a manual detection mode in the prior art are solved, and production efficiency is greatly improved.
本发明提供一种电子元器件外观检测装置，包</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
| title | Electronic assembly appearance detection device |
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