Optoelectronic oscillator for measuring humidity and measuring method thereof

Optoelectronic oscillator for measuring humidity and measuring method thereof

The invention provides an optoelectronic oscillator for measuring humidity and a measuring method thereof. The optoelectronic oscillator comprises a light source, a first optical coupler, an adjustable optical time delay module, an optical fiber sensing head coated with a humidity-sensitive material...

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Hauptverfasser: FAN GUOFANG, MOU HONGQIAN, LIU YAN, WANG MUGUANG, ZHANG NAIHAN, WU BEILEI, ZHANG JING
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator FAN GUOFANG
MOU HONGQIAN
LIU YAN
WANG MUGUANG
ZHANG NAIHAN
WU BEILEI
ZHANG JING
description The invention provides an optoelectronic oscillator for measuring humidity and a measuring method thereof. The optoelectronic oscillator comprises a light source, a first optical coupler, an adjustable optical time delay module, an optical fiber sensing head coated with a humidity-sensitive material, a second optical coupler, an electro-optical modulator, a dispersion element, an optical amplifier, a photoelectric detector, a microwave amplifier and a power divider. A Mach-Zehnder interferometer MZI is formed by the first optical coupler, the second optical coupler, the optical fiber sensing head which is arranged between the first optical coupler and the second optical coupler and is coated with the humidity-sensitive material, and the adjustable optical time delay module; and the opticalfiber sensing head coated with the humidity-sensitive material is positioned in one arm of the MZI and is used for sensing humidity to perform corresponding telescopic deformation. A microwave photontechnology is utilized, t
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Optoelectronic oscillator for measuring humidity and measuring method thereof
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