Fault detection device for electronic chip
The invention provides a fault detection device for an electronic chip. The device comprises a software detection module, a hardware detection module, an operation state detection module and a generation module, wherein the software detection module comprises a processing unit, an input unit and an...
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| creator | SUN LEI CHEN LUNSEN XU HAICAI |
| description | The invention provides a fault detection device for an electronic chip. The device comprises a software detection module, a hardware detection module, an operation state detection module and a generation module, wherein the software detection module comprises a processing unit, an input unit and an output unit, the input unit is connected to an input interface of a chip to be detected, the outputmodule is connected to an output interface of the chip to be detected, the processing unit inputs a test sample to the chip to be detected through the input unit, receives an output result of the chipto be detected through the output unit, and detects the correctness of the output result; the hardware detection module is used for acquiring a chip image to be detected, and detecting an external defect of the chip to be detected through the chip image to be detected; the operation state detection module is used for detecting the heating temperature of the chip to be detected during operation; and the generation module g |
| format | Patent |
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The device comprises a software detection module, a hardware detection module, an operation state detection module and a generation module, wherein the software detection module comprises a processing unit, an input unit and an output unit, the input unit is connected to an input interface of a chip to be detected, the outputmodule is connected to an output interface of the chip to be detected, the processing unit inputs a test sample to the chip to be detected through the input unit, receives an output result of the chipto be detected through the output unit, and detects the correctness of the output result; the hardware detection module is used for acquiring a chip image to be detected, and detecting an external defect of the chip to be detected through the chip image to be detected; the operation state detection module is used for detecting the heating temperature of the chip to be detected during operation; and the generation module g</description><language>chi ; eng</language><subject>ACCESSORIES THEREFOR ; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES ; APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM ; CINEMATOGRAPHY ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHOTOGRAPHY ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190611&DB=EPODOC&CC=CN&NR=109870463A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190611&DB=EPODOC&CC=CN&NR=109870463A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SUN LEI</creatorcontrib><creatorcontrib>CHEN LUNSEN</creatorcontrib><creatorcontrib>XU HAICAI</creatorcontrib><title>Fault detection device for electronic chip</title><description>The invention provides a fault detection device for an electronic chip. The device comprises a software detection module, a hardware detection module, an operation state detection module and a generation module, wherein the software detection module comprises a processing unit, an input unit and an output unit, the input unit is connected to an input interface of a chip to be detected, the outputmodule is connected to an output interface of the chip to be detected, the processing unit inputs a test sample to the chip to be detected through the input unit, receives an output result of the chipto be detected through the output unit, and detects the correctness of the output result; the hardware detection module is used for acquiring a chip image to be detected, and detecting an external defect of the chip to be detected through the chip image to be detected; the operation state detection module is used for detecting the heating temperature of the chip to be detected during operation; and the generation module g</description><subject>ACCESSORIES THEREFOR</subject><subject>APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES</subject><subject>APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHOTOGRAPHY</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBySyzNKVFISS1JTS7JzM8Dssoyk1MV0vKLFFJzgGJF-XmZyQrJGZkFPAysaYk5xam8UJqbQdHNNcTZQze1ID8-tbggMTk1L7Uk3tnP0MDSwtzAxMzY0ZgYNQAnSCj7</recordid><startdate>20190611</startdate><enddate>20190611</enddate><creator>SUN LEI</creator><creator>CHEN LUNSEN</creator><creator>XU HAICAI</creator><scope>EVB</scope></search><sort><creationdate>20190611</creationdate><title>Fault detection device for electronic chip</title><author>SUN LEI ; CHEN LUNSEN ; XU HAICAI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN109870463A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>ACCESSORIES THEREFOR</topic><topic>APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES</topic><topic>APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHOTOGRAPHY</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SUN LEI</creatorcontrib><creatorcontrib>CHEN LUNSEN</creatorcontrib><creatorcontrib>XU HAICAI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SUN LEI</au><au>CHEN LUNSEN</au><au>XU HAICAI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Fault detection device for electronic chip</title><date>2019-06-11</date><risdate>2019</risdate><abstract>The invention provides a fault detection device for an electronic chip. The device comprises a software detection module, a hardware detection module, an operation state detection module and a generation module, wherein the software detection module comprises a processing unit, an input unit and an output unit, the input unit is connected to an input interface of a chip to be detected, the outputmodule is connected to an output interface of the chip to be detected, the processing unit inputs a test sample to the chip to be detected through the input unit, receives an output result of the chipto be detected through the output unit, and detects the correctness of the output result; the hardware detection module is used for acquiring a chip image to be detected, and detecting an external defect of the chip to be detected through the chip image to be detected; the operation state detection module is used for detecting the heating temperature of the chip to be detected during operation; and the generation module g</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | ACCESSORIES THEREFOR APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM CINEMATOGRAPHY ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY ELECTROGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHOTOGRAPHY PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
| title | Fault detection device for electronic chip |
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