Self-identification test method for variable-channel time series signals
The invention discloses a self-identification test method for variable-channel time series signals, which can realize universal test of time series signals for different types of carrier rockets and avoid the modification of system application software and hardware due to the different numbers of ch...
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| creator | YAO JINGBO YANG CHEN CUI CUNYAN WANG HUAIPENG XIN CHAOJUN XIE WEIQI LI YAN CAI YUANWEN |
| description | The invention discloses a self-identification test method for variable-channel time series signals, which can realize universal test of time series signals for different types of carrier rockets and avoid the modification of system application software and hardware due to the different numbers of channels of time series signals. The self-identification test method for variable-channel time seriessignals of the invention mainly includes the following steps: firstly, idle pins at the upper and lower ends of a CPCI bus connector and a +5V voltage signal of a backplane constitute a board in-placedetection device and a detection signal; secondly, an FPGA verifies the detection signal to judge the reliable number of in-place boards; thirdly, the number of test channels of time series signals is determined according to the number of boards and the number of channels of the isolation conditioning circuit on each board; and finally, the test software is adaptively configured based on the number of test channels, and t |
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| title | Self-identification test method for variable-channel time series signals |
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