Half-wave detecting method and half-wave detecting system
The invention provides a half-wave detecting method and a half-wave detecting system, wherein the method and the system relate to the field of laminated power supply half-wave detecting technology. The half-wave detecting method comprises the steps of determining a tap branch circuit at the output e...
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creator | FENG LIANG DU DEYAO |
description | The invention provides a half-wave detecting method and a half-wave detecting system, wherein the method and the system relate to the field of laminated power supply half-wave detecting technology. The half-wave detecting method comprises the steps of determining a tap branch circuit at the output end of a transformer through a triggering pulse; respectively controlling a silicon controlled rectifier through the triggering pulse for obtaining laminated voltages which are output from two adjacent tap branch circuits, respectively acquiring positive half-wave voltage values and negative half-wave voltage values of the voltages which are fed back from the adjacent tap branch circuits; comparing the positive half-wave voltage values and the negative half-wave voltage values of the voltages which are fed back from the adjacent tap branch circuits for obtaining a difference; determining whether a fault occurs in the bidirectional silicon controlled rectifier in the tap branch circuit which corresponds with the diff |
format | Patent |
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The half-wave detecting method comprises the steps of determining a tap branch circuit at the output end of a transformer through a triggering pulse; respectively controlling a silicon controlled rectifier through the triggering pulse for obtaining laminated voltages which are output from two adjacent tap branch circuits, respectively acquiring positive half-wave voltage values and negative half-wave voltage values of the voltages which are fed back from the adjacent tap branch circuits; comparing the positive half-wave voltage values and the negative half-wave voltage values of the voltages which are fed back from the adjacent tap branch circuits for obtaining a difference; determining whether a fault occurs in the bidirectional silicon controlled rectifier in the tap branch circuit which corresponds with the diff</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190329&DB=EPODOC&CC=CN&NR=109541345A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190329&DB=EPODOC&CC=CN&NR=109541345A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FENG LIANG</creatorcontrib><creatorcontrib>DU DEYAO</creatorcontrib><title>Half-wave detecting method and half-wave detecting system</title><description>The invention provides a half-wave detecting method and a half-wave detecting system, wherein the method and the system relate to the field of laminated power supply half-wave detecting technology. 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language | chi ; eng |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Half-wave detecting method and half-wave detecting system |
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