Method and device for diagnosing defects of laser additive manufacturing

The invention relates to a method and a device for diagnosing defects of laser additive manufacturing, in order to overcome the defect of flaw diagnosis during the process of laser additive manufacturing. The method specifically comprises the following steps: (1) utilizing a spectrum sensing information collecting device to collect spectrum information, thereby acquiring a time domain map of spectral line intensity fluctuating following time; (2) utilizing a visual sensing information collecting device to collect visual information, thereby acquiring a time domain map of molten pool area changing following time; (3) performing manufacturing defect analysis on the time domain maps acquired in steps (1) and (2); (4) unifying a time shaft and performing mid-value or mean filtering treatment on the time domain map acquired in the step (3), and normalizing the treated data; (5) utilizing a weighted average algorithm to perform information fusion and performing filtering treatment, thereby acquiring a weighted aver