Accelerate life test method and device for charging device

The invention provides an accelerate life test method and a device for a charging device. The accelerate life test method comprises: calculating the normal test time of a single charging device basedon the design life time, the reliability and the allowable failure number of the charging device; sel...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YANG MINHUA, FANG PENGWEI, YANG GUOSEN, HUANG JIAN, JI BINGNAN, HOU YAJING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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