Accelerate life test method and device for charging device

Accelerate life test method and device for charging device

The invention provides an accelerate life test method and a device for a charging device. The accelerate life test method comprises: calculating the normal test time of a single charging device basedon the design life time, the reliability and the allowable failure number of the charging device; sel...

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Hauptverfasser: YANG MINHUA, FANG PENGWEI, YANG GUOSEN, HUANG JIAN, JI BINGNAN, HOU YAJING
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator YANG MINHUA
FANG PENGWEI
YANG GUOSEN
HUANG JIAN
JI BINGNAN
HOU YAJING
description The invention provides an accelerate life test method and a device for a charging device. The accelerate life test method comprises: calculating the normal test time of a single charging device basedon the design life time, the reliability and the allowable failure number of the charging device; selecting a temperature affecting the life of the charging device as an acceleration stress, calculating a temperature acceleration factor, and calculating an accelerate life test time of the single charging device based on the temperature acceleration factor and the normal test time of the single charging device; and performing a cyclic test on the charging device according to a set temperature change curve until the accelerate life test time is reached, and determining whether the charging device is invalid. The accelerate life test method can greatly shorten the life test time of the charging device, improve the life test efficiency and the life test reliability of the charging device, andconfirm the life of the ch
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Accelerate life test method and device for charging device
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