Method and device for determining incident angle of terahertz wave reflection measurement system

The invention relates to a method for determining an incident angle of a terahertz wave reflection measurement system. The method comprises the following steps of: obtaining a first calibration plateand a second calibration plate by a terahertz wave transmission measurement, wherein the first calibr...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHAO ZENGMING, CAI HE, ZHENG YAN, YIN HONGCHENG, ZHANG XUTAO, SUN JINHAI, LIU YONGQIANG, ZHANG JING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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