Device for detecting linearity of forward scattering visibility meter

Device for detecting linearity of forward scattering visibility meter

The invention discloses a device for detecting linearity of a forward scattering visibility meter. The device is a spectroscopic integrating sphere (5) connected with an incident light guide pipe (3)and a luminous flux regulator (4) connected in series, and with a photoelectric detecting reference m...

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Hauptverfasser: WANG WEI, FANG HAITAO, WANG MIN, WANG MAOCUI, ZHANG SHIGUO, LYU GANG
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator WANG WEI
FANG HAITAO
WANG MIN
WANG MAOCUI
ZHANG SHIGUO
LYU GANG
description The invention discloses a device for detecting linearity of a forward scattering visibility meter. The device is a spectroscopic integrating sphere (5) connected with an incident light guide pipe (3)and a luminous flux regulator (4) connected in series, and with a photoelectric detecting reference member (6) and an emitted light guide pipe (7). The photoelectric detecting reference member (6) iscomposed by a photoelectric detector, an analog to digital converter and a data processor connected in series. The output of the optical receiver (8) of the forward scattering visibility meter is electrically connected to the analog to digital converter for using the data processor to derive the ratio IA/IB=k from the output IA of the photoelectric detector and the output IB of the optical receiver (8), and obtaining the k value under different light intensities according to the change of the output light intensity of the luminous flux regulator (4). If the changing rate of the k value is lessthan 10%, it is determined
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Device for detecting linearity of forward scattering visibility meter
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