Apparatus and method for quantitative test of defect in slender magnetic-conductive component

Apparatus and method for quantitative test of defect in slender magnetic-conductive component

An equipment for quantitative detection of defect in slender magnetic-conductive member is composed of magnetizer, magnetic leakage tester, displacement measurer and encoder, signal preprocessor, A/D converter and computer-aided analysis system. The first three are fixed together and send a trigger...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HUANG RUI, KANG YIHUA, YANG KECHONG
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An equipment for quantitative detection of defect in slender magnetic-conductive member is composed of magnetizer, magnetic leakage tester, displacement measurer and encoder, signal preprocessor, A/D converter and computer-aided analysis system. The first three are fixed together and send a trigger pulse at a certain space interval to the last two for recording.