Micro-discharge test system based on wave absorbing darkroom
A micro-discharge test system based on a wave absorbing darkroom comprises a transmitting source component (1), a test tank (2), a wave-transparent glass window (3), a microwave antenna (4), a vacuumpump (5), a temperature control device (6), and a wave absorbing darkroom (8). The wave absorbing dar...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | CHAI JIZE LI YANPING SUN QINFEN WANG HAILIN HU SHAOGUANG GUO LUCHUAN WANG BAOXIN SHUANG LONGLONG PENG LU |
| description | A micro-discharge test system based on a wave absorbing darkroom comprises a transmitting source component (1), a test tank (2), a wave-transparent glass window (3), a microwave antenna (4), a vacuumpump (5), a temperature control device (6), and a wave absorbing darkroom (8). The wave absorbing darkroom (8) absorbs the radiation power to ensure system safety. The transmitting source component (1) sends a test carrier signal to the microwave antenna (4) and monitors the test carrier signal strength transmitted and received by the microwave antenna (4). The system solves the problem that a wave absorbing box of a conventional test system is limited in the absorption power and poor in heat dissipation, has better structural stability and higher safety.
种基于吸波暗室的微放电测试系统，包括发射源组件(1)、测试罐体(2)、透波玻璃窗(3)、微波天线(4)、真空泵(5)、温控设备(6)、吸波暗室(8)，通过设置吸波暗室(8)对辐射功率进行吸收保证系统安全性，利用发射源组件(1)向微波天线(4)发送测试载波信号并监测微波天线(4)收发的测试载波信号强度，解决了现有测试系统使用的吸波箱吸收功率受限，散热不足的问题，结构稳定性更好，安全性更高。 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN108761217A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN108761217A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN108761217A3</originalsourceid><addsrcrecordid>eNrjZLDxzUwuytdNySxOzkgsSk9VKEktLlEoriwuSc1VSEosTk1RyM9TKE8sS1VITCrOL0rKzEtXSEksyi7Kz8_lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GBhbmZoZGhuaOxsSoAQDtMi_g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Micro-discharge test system based on wave absorbing darkroom</title><source>esp@cenet</source><creator>CHAI JIZE ; LI YANPING ; SUN QINFEN ; WANG HAILIN ; HU SHAOGUANG ; GUO LUCHUAN ; WANG BAOXIN ; SHUANG LONGLONG ; PENG LU</creator><creatorcontrib>CHAI JIZE ; LI YANPING ; SUN QINFEN ; WANG HAILIN ; HU SHAOGUANG ; GUO LUCHUAN ; WANG BAOXIN ; SHUANG LONGLONG ; PENG LU</creatorcontrib><description>A micro-discharge test system based on a wave absorbing darkroom comprises a transmitting source component (1), a test tank (2), a wave-transparent glass window (3), a microwave antenna (4), a vacuumpump (5), a temperature control device (6), and a wave absorbing darkroom (8). The wave absorbing darkroom (8) absorbs the radiation power to ensure system safety. The transmitting source component (1) sends a test carrier signal to the microwave antenna (4) and monitors the test carrier signal strength transmitted and received by the microwave antenna (4). The system solves the problem that a wave absorbing box of a conventional test system is limited in the absorption power and poor in heat dissipation, has better structural stability and higher safety.
种基于吸波暗室的微放电测试系统，包括发射源组件(1)、测试罐体(2)、透波玻璃窗(3)、微波天线(4)、真空泵(5)、温控设备(6)、吸波暗室(8)，通过设置吸波暗室(8)对辐射功率进行吸收保证系统安全性，利用发射源组件(1)向微波天线(4)发送测试载波信号并监测微波天线(4)收发的测试载波信号强度，解决了现有测试系统使用的吸波箱吸收功率受限，散热不足的问题，结构稳定性更好，安全性更高。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181106&DB=EPODOC&CC=CN&NR=108761217A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181106&DB=EPODOC&CC=CN&NR=108761217A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHAI JIZE</creatorcontrib><creatorcontrib>LI YANPING</creatorcontrib><creatorcontrib>SUN QINFEN</creatorcontrib><creatorcontrib>WANG HAILIN</creatorcontrib><creatorcontrib>HU SHAOGUANG</creatorcontrib><creatorcontrib>GUO LUCHUAN</creatorcontrib><creatorcontrib>WANG BAOXIN</creatorcontrib><creatorcontrib>SHUANG LONGLONG</creatorcontrib><creatorcontrib>PENG LU</creatorcontrib><title>Micro-discharge test system based on wave absorbing darkroom</title><description>A micro-discharge test system based on a wave absorbing darkroom comprises a transmitting source component (1), a test tank (2), a wave-transparent glass window (3), a microwave antenna (4), a vacuumpump (5), a temperature control device (6), and a wave absorbing darkroom (8). The wave absorbing darkroom (8) absorbs the radiation power to ensure system safety. The transmitting source component (1) sends a test carrier signal to the microwave antenna (4) and monitors the test carrier signal strength transmitted and received by the microwave antenna (4). The system solves the problem that a wave absorbing box of a conventional test system is limited in the absorption power and poor in heat dissipation, has better structural stability and higher safety.
种基于吸波暗室的微放电测试系统，包括发射源组件(1)、测试罐体(2)、透波玻璃窗(3)、微波天线(4)、真空泵(5)、温控设备(6)、吸波暗室(8)，通过设置吸波暗室(8)对辐射功率进行吸收保证系统安全性，利用发射源组件(1)向微波天线(4)发送测试载波信号并监测微波天线(4)收发的测试载波信号强度，解决了现有测试系统使用的吸波箱吸收功率受限，散热不足的问题，结构稳定性更好，安全性更高。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDxzUwuytdNySxOzkgsSk9VKEktLlEoriwuSc1VSEosTk1RyM9TKE8sS1VITCrOL0rKzEtXSEksyi7Kz8_lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GBhbmZoZGhuaOxsSoAQDtMi_g</recordid><startdate>20181106</startdate><enddate>20181106</enddate><creator>CHAI JIZE</creator><creator>LI YANPING</creator><creator>SUN QINFEN</creator><creator>WANG HAILIN</creator><creator>HU SHAOGUANG</creator><creator>GUO LUCHUAN</creator><creator>WANG BAOXIN</creator><creator>SHUANG LONGLONG</creator><creator>PENG LU</creator><scope>EVB</scope></search><sort><creationdate>20181106</creationdate><title>Micro-discharge test system based on wave absorbing darkroom</title><author>CHAI JIZE ; LI YANPING ; SUN QINFEN ; WANG HAILIN ; HU SHAOGUANG ; GUO LUCHUAN ; WANG BAOXIN ; SHUANG LONGLONG ; PENG LU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN108761217A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2018</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHAI JIZE</creatorcontrib><creatorcontrib>LI YANPING</creatorcontrib><creatorcontrib>SUN QINFEN</creatorcontrib><creatorcontrib>WANG HAILIN</creatorcontrib><creatorcontrib>HU SHAOGUANG</creatorcontrib><creatorcontrib>GUO LUCHUAN</creatorcontrib><creatorcontrib>WANG BAOXIN</creatorcontrib><creatorcontrib>SHUANG LONGLONG</creatorcontrib><creatorcontrib>PENG LU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHAI JIZE</au><au>LI YANPING</au><au>SUN QINFEN</au><au>WANG HAILIN</au><au>HU SHAOGUANG</au><au>GUO LUCHUAN</au><au>WANG BAOXIN</au><au>SHUANG LONGLONG</au><au>PENG LU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Micro-discharge test system based on wave absorbing darkroom</title><date>2018-11-06</date><risdate>2018</risdate><abstract>A micro-discharge test system based on a wave absorbing darkroom comprises a transmitting source component (1), a test tank (2), a wave-transparent glass window (3), a microwave antenna (4), a vacuumpump (5), a temperature control device (6), and a wave absorbing darkroom (8). The wave absorbing darkroom (8) absorbs the radiation power to ensure system safety. The transmitting source component (1) sends a test carrier signal to the microwave antenna (4) and monitors the test carrier signal strength transmitted and received by the microwave antenna (4). The system solves the problem that a wave absorbing box of a conventional test system is limited in the absorption power and poor in heat dissipation, has better structural stability and higher safety.
种基于吸波暗室的微放电测试系统，包括发射源组件(1)、测试罐体(2)、透波玻璃窗(3)、微波天线(4)、真空泵(5)、温控设备(6)、吸波暗室(8)，通过设置吸波暗室(8)对辐射功率进行吸收保证系统安全性，利用发射源组件(1)向微波天线(4)发送测试载波信号并监测微波天线(4)收发的测试载波信号强度，解决了现有测试系统使用的吸波箱吸收功率受限，散热不足的问题，结构稳定性更好，安全性更高。</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN108761217A |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Micro-discharge test system based on wave absorbing darkroom |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T21%3A21%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHAI%20JIZE&rft.date=2018-11-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN108761217A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |