MACHINED SURFACE QUALITY EVALUATION DEVICE

The invention provides a machined surface quality evaluation device. The machined surface quality evaluation device includes a machine learning device that learns a result of evaluation on machined surface quality of a workpiece by an observer which correspond to an inspection result on the machined...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KAYANUMA TOMOKAZU, AIZAWA NOBUAKI, TONG ZHENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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