Tray device suitable for multiple measuring instruments
The invention provides a tray device suitable for multiple measuring instruments. The tray device comprises a first instrument placement area and a second instrument placement area; the first instrument placement area comprises a first opening, a first fixing groove and first limiting modules; the s...
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creator | CUI WENWU JU HANJI ZHAO SIXIANG DING HENGCHUN WANG GUIXIAN WANG YANQIN MIAO HONGYING WANG YANG WU ZHEN YUAN RUIMING JIANG ZHENYU HAN DI PANG FUKUAN |
description | The invention provides a tray device suitable for multiple measuring instruments. The tray device comprises a first instrument placement area and a second instrument placement area; the first instrument placement area comprises a first opening, a first fixing groove and first limiting modules; the second instrument placement area comprises a second opening, a second fixing groove and second limiting modules; the first instrument placement area and the second instrument placement area are partitioned through a public connection side; the first instrument placement area is used for placing the first measuring instruments; the second instrument placement area is used for placing the second measuring instruments; the first limiting modules are arranged at the first opening in the first fixinggroove; the second limiting modules are arranged in the second fixing groove. By means of the tray device, the measuring instruments with different sizes are fixed through the first instrument placement area and the second in |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN108717131A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN108717131A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN108717131A3</originalsourceid><addsrcrecordid>eNrjZDAPKUqsVEhJLctMTlUoLs0sSUzKSVVIyy9SyC3NKcksAHJyUxOLS4sy89IVMvOKS4pKc1PzSop5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakm8s5-hgYW5obmhsaGjMTFqABEDLos</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Tray device suitable for multiple measuring instruments</title><source>esp@cenet</source><creator>CUI WENWU ; JU HANJI ; ZHAO SIXIANG ; DING HENGCHUN ; WANG GUIXIAN ; WANG YANQIN ; MIAO HONGYING ; WANG YANG ; WU ZHEN ; YUAN RUIMING ; JIANG ZHENYU ; HAN DI ; PANG FUKUAN</creator><creatorcontrib>CUI WENWU ; JU HANJI ; ZHAO SIXIANG ; DING HENGCHUN ; WANG GUIXIAN ; WANG YANQIN ; MIAO HONGYING ; WANG YANG ; WU ZHEN ; YUAN RUIMING ; JIANG ZHENYU ; HAN DI ; PANG FUKUAN</creatorcontrib><description>The invention provides a tray device suitable for multiple measuring instruments. The tray device comprises a first instrument placement area and a second instrument placement area; the first instrument placement area comprises a first opening, a first fixing groove and first limiting modules; the second instrument placement area comprises a second opening, a second fixing groove and second limiting modules; the first instrument placement area and the second instrument placement area are partitioned through a public connection side; the first instrument placement area is used for placing the first measuring instruments; the second instrument placement area is used for placing the second measuring instruments; the first limiting modules are arranged at the first opening in the first fixinggroove; the second limiting modules are arranged in the second fixing groove. By means of the tray device, the measuring instruments with different sizes are fixed through the first instrument placement area and the second in</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181030&DB=EPODOC&CC=CN&NR=108717131A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181030&DB=EPODOC&CC=CN&NR=108717131A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CUI WENWU</creatorcontrib><creatorcontrib>JU HANJI</creatorcontrib><creatorcontrib>ZHAO SIXIANG</creatorcontrib><creatorcontrib>DING HENGCHUN</creatorcontrib><creatorcontrib>WANG GUIXIAN</creatorcontrib><creatorcontrib>WANG YANQIN</creatorcontrib><creatorcontrib>MIAO HONGYING</creatorcontrib><creatorcontrib>WANG YANG</creatorcontrib><creatorcontrib>WU ZHEN</creatorcontrib><creatorcontrib>YUAN RUIMING</creatorcontrib><creatorcontrib>JIANG ZHENYU</creatorcontrib><creatorcontrib>HAN DI</creatorcontrib><creatorcontrib>PANG FUKUAN</creatorcontrib><title>Tray device suitable for multiple measuring instruments</title><description>The invention provides a tray device suitable for multiple measuring instruments. The tray device comprises a first instrument placement area and a second instrument placement area; the first instrument placement area comprises a first opening, a first fixing groove and first limiting modules; the second instrument placement area comprises a second opening, a second fixing groove and second limiting modules; the first instrument placement area and the second instrument placement area are partitioned through a public connection side; the first instrument placement area is used for placing the first measuring instruments; the second instrument placement area is used for placing the second measuring instruments; the first limiting modules are arranged at the first opening in the first fixinggroove; the second limiting modules are arranged in the second fixing groove. By means of the tray device, the measuring instruments with different sizes are fixed through the first instrument placement area and the second in</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAPKUqsVEhJLctMTlUoLs0sSUzKSVVIyy9SyC3NKcksAHJyUxOLS4sy89IVMvOKS4pKc1PzSop5GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakm8s5-hgYW5obmhsaGjMTFqABEDLos</recordid><startdate>20181030</startdate><enddate>20181030</enddate><creator>CUI WENWU</creator><creator>JU HANJI</creator><creator>ZHAO SIXIANG</creator><creator>DING HENGCHUN</creator><creator>WANG GUIXIAN</creator><creator>WANG YANQIN</creator><creator>MIAO HONGYING</creator><creator>WANG YANG</creator><creator>WU ZHEN</creator><creator>YUAN RUIMING</creator><creator>JIANG ZHENYU</creator><creator>HAN DI</creator><creator>PANG FUKUAN</creator><scope>EVB</scope></search><sort><creationdate>20181030</creationdate><title>Tray device suitable for multiple measuring instruments</title><author>CUI WENWU ; JU HANJI ; ZHAO SIXIANG ; DING HENGCHUN ; WANG GUIXIAN ; WANG YANQIN ; MIAO HONGYING ; WANG YANG ; WU ZHEN ; YUAN RUIMING ; JIANG ZHENYU ; HAN DI ; PANG FUKUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN108717131A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2018</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CUI WENWU</creatorcontrib><creatorcontrib>JU HANJI</creatorcontrib><creatorcontrib>ZHAO SIXIANG</creatorcontrib><creatorcontrib>DING HENGCHUN</creatorcontrib><creatorcontrib>WANG GUIXIAN</creatorcontrib><creatorcontrib>WANG YANQIN</creatorcontrib><creatorcontrib>MIAO HONGYING</creatorcontrib><creatorcontrib>WANG YANG</creatorcontrib><creatorcontrib>WU ZHEN</creatorcontrib><creatorcontrib>YUAN RUIMING</creatorcontrib><creatorcontrib>JIANG ZHENYU</creatorcontrib><creatorcontrib>HAN DI</creatorcontrib><creatorcontrib>PANG FUKUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CUI WENWU</au><au>JU HANJI</au><au>ZHAO SIXIANG</au><au>DING HENGCHUN</au><au>WANG GUIXIAN</au><au>WANG YANQIN</au><au>MIAO HONGYING</au><au>WANG YANG</au><au>WU ZHEN</au><au>YUAN RUIMING</au><au>JIANG ZHENYU</au><au>HAN DI</au><au>PANG FUKUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Tray device suitable for multiple measuring instruments</title><date>2018-10-30</date><risdate>2018</risdate><abstract>The invention provides a tray device suitable for multiple measuring instruments. The tray device comprises a first instrument placement area and a second instrument placement area; the first instrument placement area comprises a first opening, a first fixing groove and first limiting modules; the second instrument placement area comprises a second opening, a second fixing groove and second limiting modules; the first instrument placement area and the second instrument placement area are partitioned through a public connection side; the first instrument placement area is used for placing the first measuring instruments; the second instrument placement area is used for placing the second measuring instruments; the first limiting modules are arranged at the first opening in the first fixinggroove; the second limiting modules are arranged in the second fixing groove. By means of the tray device, the measuring instruments with different sizes are fixed through the first instrument placement area and the second in</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Tray device suitable for multiple measuring instruments |
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