Display substrate and manufacturing method thereof, detection method
The invention relates to the technical field of the display, and discloses a display substrate and a manufacturing method thereof, and a detection method. The display substrate comprises multiple signal lines, and a passivation layer covering the signal lines, and at least one conductive pattern; at...
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| creator | JIA DONGWANG MENG JIA |
| description | The invention relates to the technical field of the display, and discloses a display substrate and a manufacturing method thereof, and a detection method. The display substrate comprises multiple signal lines, and a passivation layer covering the signal lines, and at least one conductive pattern; at least one conductive pattern is arranged on a surface, deviated from the signal lines, of the passivation layer; each conductive pattern comprises at least one conductive line segment, and each signal line is corresponding to the location of one conductive line segment, and the positive projection,on the plane of the display substrate, of each signal line is located in the positive projection, on the plane of the display substrate, of the corresponding conductive line segment. Through the above technical scheme disclosed by the invention, whether the signal line is damaged can be judged by detecting whether the conductive pattern is damaged, and the fast detection efficiency is provided. Furthermore, the location |
| format | Patent |
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The display substrate comprises multiple signal lines, and a passivation layer covering the signal lines, and at least one conductive pattern; at least one conductive pattern is arranged on a surface, deviated from the signal lines, of the passivation layer; each conductive pattern comprises at least one conductive line segment, and each signal line is corresponding to the location of one conductive line segment, and the positive projection,on the plane of the display substrate, of each signal line is located in the positive projection, on the plane of the display substrate, of the corresponding conductive line segment. Through the above technical scheme disclosed by the invention, whether the signal line is damaged can be judged by detecting whether the conductive pattern is damaged, and the fast detection efficiency is provided. 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| language | chi ; eng |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | Display substrate and manufacturing method thereof, detection method |
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