METHOD FOR ADJUSTING MEASURING DEVICE

METHOD FOR ADJUSTING MEASURING DEVICE

The invention relates to a method for adjusting a measuring device. The method comprises the steps of performing a first laboratory calibration of the measuring device based upon at least one measurement signal detected by a measuring sensor in a calibration solution; performing a second laboratory...

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Hauptverfasser: PETER LINDMUELLER, FRANK MUELLER, DANIEL ITEN
Format: Patent
Sprache:chi ; eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator PETER LINDMUELLER
FRANK MUELLER
DANIEL ITEN
description The invention relates to a method for adjusting a measuring device. The method comprises the steps of performing a first laboratory calibration of the measuring device based upon at least one measurement signal detected by a measuring sensor in a calibration solution; performing a second laboratory calibration of the measuring device based upon at least one measurement signal detected by a measuring sensor in air; determining a correction factor for correcting a laboratory calibration value of the measuring device based upon the at least one measurement signal detected by the at least one measuring sensor in air to a laboratory calibration value of the measuring device based upon the at least one measurement signal detected by the at least one measuring sensor in the calibration solution;performing an on-site calibration of the measuring device based upon at least one measurement signal detected by the a measuring sensor in air to produce an on-site calibration value; correcting the on-site calibration value
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD FOR ADJUSTING MEASURING DEVICE
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