A system used for detecting analyte

A system used for detecting analyte is described. The system includes a fluorescence detector. The fluorescence detector comprises a light source, a condensing lens obtaining a solid angle of 10 degrees or above, and an object lens obtaining a solid angle of 10 degrees or above. 本发明描述了种用于检测分析物的系统,所述...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ERMANTRAUT EUGEN, BEIER VICO, SCHULZ TORSTEN, TUCHSCHEERER JENS, WOSTEMEYER ANKE, KAISER THOMAS
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ERMANTRAUT EUGEN
BEIER VICO
SCHULZ TORSTEN
TUCHSCHEERER JENS
WOSTEMEYER ANKE
KAISER THOMAS
description A system used for detecting analyte is described. The system includes a fluorescence detector. The fluorescence detector comprises a light source, a condensing lens obtaining a solid angle of 10 degrees or above, and an object lens obtaining a solid angle of 10 degrees or above. 本发明描述了种用于检测分析物的系统,所述系统包括:荧光检测器,其包括:光源;获得10°或以上的立体角的聚光透镜;和获得10°或以上的立体角的物镜。
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN108088824A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN108088824A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN108088824A3</originalsourceid><addsrcrecordid>eNrjZFB2VCiuLC5JzVUoLU5NUUjLL1JISS1JTS7JzEtXSMxLzKksSeVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoYGFgYWFhZGJo7GxKgBAMSrJjs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>A system used for detecting analyte</title><source>esp@cenet</source><creator>ERMANTRAUT EUGEN ; BEIER VICO ; SCHULZ TORSTEN ; TUCHSCHEERER JENS ; WOSTEMEYER ANKE ; KAISER THOMAS</creator><creatorcontrib>ERMANTRAUT EUGEN ; BEIER VICO ; SCHULZ TORSTEN ; TUCHSCHEERER JENS ; WOSTEMEYER ANKE ; KAISER THOMAS</creatorcontrib><description>A system used for detecting analyte is described. The system includes a fluorescence detector. The fluorescence detector comprises a light source, a condensing lens obtaining a solid angle of 10 degrees or above, and an object lens obtaining a solid angle of 10 degrees or above. 本发明描述了种用于检测分析物的系统,所述系统包括:荧光检测器,其包括:光源;获得10°或以上的立体角的聚光透镜;和获得10°或以上的立体角的物镜。</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180529&amp;DB=EPODOC&amp;CC=CN&amp;NR=108088824A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180529&amp;DB=EPODOC&amp;CC=CN&amp;NR=108088824A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ERMANTRAUT EUGEN</creatorcontrib><creatorcontrib>BEIER VICO</creatorcontrib><creatorcontrib>SCHULZ TORSTEN</creatorcontrib><creatorcontrib>TUCHSCHEERER JENS</creatorcontrib><creatorcontrib>WOSTEMEYER ANKE</creatorcontrib><creatorcontrib>KAISER THOMAS</creatorcontrib><title>A system used for detecting analyte</title><description>A system used for detecting analyte is described. The system includes a fluorescence detector. The fluorescence detector comprises a light source, a condensing lens obtaining a solid angle of 10 degrees or above, and an object lens obtaining a solid angle of 10 degrees or above. 本发明描述了种用于检测分析物的系统,所述系统包括:荧光检测器,其包括:光源;获得10°或以上的立体角的聚光透镜;和获得10°或以上的立体角的物镜。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB2VCiuLC5JzVUoLU5NUUjLL1JISS1JTS7JzEtXSMxLzKksSeVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoYGFgYWFhZGJo7GxKgBAMSrJjs</recordid><startdate>20180529</startdate><enddate>20180529</enddate><creator>ERMANTRAUT EUGEN</creator><creator>BEIER VICO</creator><creator>SCHULZ TORSTEN</creator><creator>TUCHSCHEERER JENS</creator><creator>WOSTEMEYER ANKE</creator><creator>KAISER THOMAS</creator><scope>EVB</scope></search><sort><creationdate>20180529</creationdate><title>A system used for detecting analyte</title><author>ERMANTRAUT EUGEN ; BEIER VICO ; SCHULZ TORSTEN ; TUCHSCHEERER JENS ; WOSTEMEYER ANKE ; KAISER THOMAS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN108088824A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ERMANTRAUT EUGEN</creatorcontrib><creatorcontrib>BEIER VICO</creatorcontrib><creatorcontrib>SCHULZ TORSTEN</creatorcontrib><creatorcontrib>TUCHSCHEERER JENS</creatorcontrib><creatorcontrib>WOSTEMEYER ANKE</creatorcontrib><creatorcontrib>KAISER THOMAS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ERMANTRAUT EUGEN</au><au>BEIER VICO</au><au>SCHULZ TORSTEN</au><au>TUCHSCHEERER JENS</au><au>WOSTEMEYER ANKE</au><au>KAISER THOMAS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A system used for detecting analyte</title><date>2018-05-29</date><risdate>2018</risdate><abstract>A system used for detecting analyte is described. The system includes a fluorescence detector. The fluorescence detector comprises a light source, a condensing lens obtaining a solid angle of 10 degrees or above, and an object lens obtaining a solid angle of 10 degrees or above. 本发明描述了种用于检测分析物的系统,所述系统包括:荧光检测器,其包括:光源;获得10°或以上的立体角的聚光透镜;和获得10°或以上的立体角的物镜。</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN108088824A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title A system used for detecting analyte
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T15%3A30%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ERMANTRAUT%20EUGEN&rft.date=2018-05-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN108088824A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true