Embedded fault diagnosis method based on correlation matrix
The invention provides an embedded fault diagnosis method based on a correlation matrix. The embedded fault diagnosis method comprises the steps of: step 1, establishing a correlation model, and optimizing a D matrix of the correlation model; step 2, judging whether failure patterns are failures bou...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | WANG SHUO ZENG ZHAOYANG JIANG JUEYI |
description | The invention provides an embedded fault diagnosis method based on a correlation matrix. The embedded fault diagnosis method comprises the steps of: step 1, establishing a correlation model, and optimizing a D matrix of the correlation model; step 2, judging whether failure patterns are failures bound to occur, possible failures, or failures certainly not going to occur; step 3, judging whether isolation units are isolation units bound to fail, isolation units possibly fail, or isolation units certainly not going to fail; step 4, and deploying a diagnostic strategy. By using the embedded faultdiagnosis method, all failure patterns of a product can be diagnosed and the faulty isolation units are isolated within a short time. Through implementing diagnosis and isolation of product failuresby adopting the embedded fault diagnosis method, the diagnosis of the failure patterns can be realized based on the correlation matrix obtained through a testability model, and the generated diagnostic strategy can be deployed |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN107966648A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN107966648A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN107966648A3</originalsourceid><addsrcrecordid>eNrjZLB2zU1KTUlJTVFISyzNKVFIyUxMz8svzixWyE0tychPUUhKLAZK5ucpJOcXFaXmJJZkAtm5iSVFmRU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_QwNzSzMzMxMLRmBg1ALI5L5s</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Embedded fault diagnosis method based on correlation matrix</title><source>esp@cenet</source><creator>WANG SHUO ; ZENG ZHAOYANG ; JIANG JUEYI</creator><creatorcontrib>WANG SHUO ; ZENG ZHAOYANG ; JIANG JUEYI</creatorcontrib><description>The invention provides an embedded fault diagnosis method based on a correlation matrix. The embedded fault diagnosis method comprises the steps of: step 1, establishing a correlation model, and optimizing a D matrix of the correlation model; step 2, judging whether failure patterns are failures bound to occur, possible failures, or failures certainly not going to occur; step 3, judging whether isolation units are isolation units bound to fail, isolation units possibly fail, or isolation units certainly not going to fail; step 4, and deploying a diagnostic strategy. By using the embedded faultdiagnosis method, all failure patterns of a product can be diagnosed and the faulty isolation units are isolated within a short time. Through implementing diagnosis and isolation of product failuresby adopting the embedded fault diagnosis method, the diagnosis of the failure patterns can be realized based on the correlation matrix obtained through a testability model, and the generated diagnostic strategy can be deployed</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180427&DB=EPODOC&CC=CN&NR=107966648A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180427&DB=EPODOC&CC=CN&NR=107966648A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG SHUO</creatorcontrib><creatorcontrib>ZENG ZHAOYANG</creatorcontrib><creatorcontrib>JIANG JUEYI</creatorcontrib><title>Embedded fault diagnosis method based on correlation matrix</title><description>The invention provides an embedded fault diagnosis method based on a correlation matrix. The embedded fault diagnosis method comprises the steps of: step 1, establishing a correlation model, and optimizing a D matrix of the correlation model; step 2, judging whether failure patterns are failures bound to occur, possible failures, or failures certainly not going to occur; step 3, judging whether isolation units are isolation units bound to fail, isolation units possibly fail, or isolation units certainly not going to fail; step 4, and deploying a diagnostic strategy. By using the embedded faultdiagnosis method, all failure patterns of a product can be diagnosed and the faulty isolation units are isolated within a short time. Through implementing diagnosis and isolation of product failuresby adopting the embedded fault diagnosis method, the diagnosis of the failure patterns can be realized based on the correlation matrix obtained through a testability model, and the generated diagnostic strategy can be deployed</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB2zU1KTUlJTVFISyzNKVFIyUxMz8svzixWyE0tychPUUhKLAZK5ucpJOcXFaXmJJZkAtm5iSVFmRU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_QwNzSzMzMxMLRmBg1ALI5L5s</recordid><startdate>20180427</startdate><enddate>20180427</enddate><creator>WANG SHUO</creator><creator>ZENG ZHAOYANG</creator><creator>JIANG JUEYI</creator><scope>EVB</scope></search><sort><creationdate>20180427</creationdate><title>Embedded fault diagnosis method based on correlation matrix</title><author>WANG SHUO ; ZENG ZHAOYANG ; JIANG JUEYI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN107966648A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG SHUO</creatorcontrib><creatorcontrib>ZENG ZHAOYANG</creatorcontrib><creatorcontrib>JIANG JUEYI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG SHUO</au><au>ZENG ZHAOYANG</au><au>JIANG JUEYI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Embedded fault diagnosis method based on correlation matrix</title><date>2018-04-27</date><risdate>2018</risdate><abstract>The invention provides an embedded fault diagnosis method based on a correlation matrix. The embedded fault diagnosis method comprises the steps of: step 1, establishing a correlation model, and optimizing a D matrix of the correlation model; step 2, judging whether failure patterns are failures bound to occur, possible failures, or failures certainly not going to occur; step 3, judging whether isolation units are isolation units bound to fail, isolation units possibly fail, or isolation units certainly not going to fail; step 4, and deploying a diagnostic strategy. By using the embedded faultdiagnosis method, all failure patterns of a product can be diagnosed and the faulty isolation units are isolated within a short time. Through implementing diagnosis and isolation of product failuresby adopting the embedded fault diagnosis method, the diagnosis of the failure patterns can be realized based on the correlation matrix obtained through a testability model, and the generated diagnostic strategy can be deployed</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN107966648A |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Embedded fault diagnosis method based on correlation matrix |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T02%3A53%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WANG%20SHUO&rft.date=2018-04-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN107966648A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |