Color depth representation method based on spectral reflectance and CIE color system
The invention proposes a color depth representation method based on spectral reflectance and a CIE color system, and the method is an objective, continuous and quantitative representation method for the color depth of a coloring material based on the color scientific theory. The method comprises the...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention proposes a color depth representation method based on spectral reflectance and a CIE color system, and the method is an objective, continuous and quantitative representation method for the color depth of a coloring material based on the color scientific theory. The method comprises the steps: calculating the color depth of the coloring material through a standard chromaticity observer of the CIE color system and a new formula according to the spectral reflectance measurement data of the coloring material. The method can be used for the representation and evaluation of the color depth, dye strength, color fastness, dye performances (elevating power, migration index and so on) of the coloring materials, such as dyed fabrics. The method and the related application relate to the fields of the spectrophotometry technology, the chromaticity technology, the dye production and coloring technology, and the fabric dyeing and processing technology.
本发明提出了种基于分光反射率和CIE表色系的颜色深度表征方法,为着色物的颜色深度提供种基于颜色科学理论的客观、连续、 |
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