Two-nozzle relative position measuring seat and measuring method
The invention discloses a two-nozzle relative position measuring seat which comprises a base and a circuit board embedded in the inner walls of four laterals sides, and one faces of exposed circuits of the circuit board are opposite to form a displacement electric-control limiting structure for a no...
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| creator | DONG ZHIGEN TAO GUOQIANG HUANG HUA HUANG JUN LIANG QUAN |
| description | The invention discloses a two-nozzle relative position measuring seat which comprises a base and a circuit board embedded in the inner walls of four laterals sides, and one faces of exposed circuits of the circuit board are opposite to form a displacement electric-control limiting structure for a nozzle a or a nozzle b in four directions. Piezoelectric ceramic wafers are pasted on upper planes of the four lateral sides of the base and at a flat bottom of an inner concave cavity to form a stroke protection structure of a Z-axis descending nozzle. The invention further comprises a measuring method applying the two-nozzle relative position measuring seat. The method respectively measures position of the nozzle a or the nozzle b and includes: acquiring Z-axis coordinate value, and then measuring X-axis coordinates of the nozzle a or the nozzle b to acquire coordinates of the middle of the nozzle; using a same method to measure coordinates of two ends and the middle of Y axis and Z-axis coordinates to acquire spat |
| format | Patent |
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Piezoelectric ceramic wafers are pasted on upper planes of the four lateral sides of the base and at a flat bottom of an inner concave cavity to form a stroke protection structure of a Z-axis descending nozzle. The invention further comprises a measuring method applying the two-nozzle relative position measuring seat. The method respectively measures position of the nozzle a or the nozzle b and includes: acquiring Z-axis coordinate value, and then measuring X-axis coordinates of the nozzle a or the nozzle b to acquire coordinates of the middle of the nozzle; using a same method to measure coordinates of two ends and the middle of Y axis and Z-axis coordinates to acquire spat</description><language>chi ; eng</language><subject>ADDITIVE MANUFACTURING TECHNOLOGY ; ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING ; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING ; PERFORMING OPERATIONS ; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR ; SHAPING OR JOINING OF PLASTICS ; TRANSPORTING ; WORKING OF PLASTICS ; WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171124&DB=EPODOC&CC=CN&NR=107379556A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171124&DB=EPODOC&CC=CN&NR=107379556A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DONG ZHIGEN</creatorcontrib><creatorcontrib>TAO GUOQIANG</creatorcontrib><creatorcontrib>HUANG HUA</creatorcontrib><creatorcontrib>HUANG JUN</creatorcontrib><creatorcontrib>LIANG QUAN</creatorcontrib><title>Two-nozzle relative position measuring seat and measuring method</title><description>The invention discloses a two-nozzle relative position measuring seat which comprises a base and a circuit board embedded in the inner walls of four laterals sides, and one faces of exposed circuits of the circuit board are opposite to form a displacement electric-control limiting structure for a nozzle a or a nozzle b in four directions. Piezoelectric ceramic wafers are pasted on upper planes of the four lateral sides of the base and at a flat bottom of an inner concave cavity to form a stroke protection structure of a Z-axis descending nozzle. The invention further comprises a measuring method applying the two-nozzle relative position measuring seat. The method respectively measures position of the nozzle a or the nozzle b and includes: acquiring Z-axis coordinate value, and then measuring X-axis coordinates of the nozzle a or the nozzle b to acquire coordinates of the middle of the nozzle; using a same method to measure coordinates of two ends and the middle of Y axis and Z-axis coordinates to acquire spat</description><subject>ADDITIVE MANUFACTURING TECHNOLOGY</subject><subject>ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING</subject><subject>AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING</subject><subject>PERFORMING OPERATIONS</subject><subject>SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR</subject><subject>SHAPING OR JOINING OF PLASTICS</subject><subject>TRANSPORTING</subject><subject>WORKING OF PLASTICS</subject><subject>WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAIKc_XzcuvqspJVShKzUksySxLVSjIL84syczPU8hNTSwuLcrMS1coTk0sUUjMS0ESyk0tychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hgbmxuaWpqZmjsbEqAEAFFMx7g</recordid><startdate>20171124</startdate><enddate>20171124</enddate><creator>DONG ZHIGEN</creator><creator>TAO GUOQIANG</creator><creator>HUANG HUA</creator><creator>HUANG JUN</creator><creator>LIANG QUAN</creator><scope>EVB</scope></search><sort><creationdate>20171124</creationdate><title>Two-nozzle relative position measuring seat and measuring method</title><author>DONG ZHIGEN ; TAO GUOQIANG ; HUANG HUA ; HUANG JUN ; LIANG QUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN107379556A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2017</creationdate><topic>ADDITIVE MANUFACTURING TECHNOLOGY</topic><topic>ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING</topic><topic>AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING</topic><topic>PERFORMING OPERATIONS</topic><topic>SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR</topic><topic>SHAPING OR JOINING OF PLASTICS</topic><topic>TRANSPORTING</topic><topic>WORKING OF PLASTICS</topic><topic>WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL</topic><toplevel>online_resources</toplevel><creatorcontrib>DONG ZHIGEN</creatorcontrib><creatorcontrib>TAO GUOQIANG</creatorcontrib><creatorcontrib>HUANG HUA</creatorcontrib><creatorcontrib>HUANG JUN</creatorcontrib><creatorcontrib>LIANG QUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DONG ZHIGEN</au><au>TAO GUOQIANG</au><au>HUANG HUA</au><au>HUANG JUN</au><au>LIANG QUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Two-nozzle relative position measuring seat and measuring method</title><date>2017-11-24</date><risdate>2017</risdate><abstract>The invention discloses a two-nozzle relative position measuring seat which comprises a base and a circuit board embedded in the inner walls of four laterals sides, and one faces of exposed circuits of the circuit board are opposite to form a displacement electric-control limiting structure for a nozzle a or a nozzle b in four directions. Piezoelectric ceramic wafers are pasted on upper planes of the four lateral sides of the base and at a flat bottom of an inner concave cavity to form a stroke protection structure of a Z-axis descending nozzle. The invention further comprises a measuring method applying the two-nozzle relative position measuring seat. The method respectively measures position of the nozzle a or the nozzle b and includes: acquiring Z-axis coordinate value, and then measuring X-axis coordinates of the nozzle a or the nozzle b to acquire coordinates of the middle of the nozzle; using a same method to measure coordinates of two ends and the middle of Y axis and Z-axis coordinates to acquire spat</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | ADDITIVE MANUFACTURING TECHNOLOGY ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING PERFORMING OPERATIONS SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS TRANSPORTING WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL |
| title | Two-nozzle relative position measuring seat and measuring method |
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