Apparatus and method for controlling an atomic emission spectrometer
A controller (316) and method for establishing safe operation of an atomic emission spectrometer (AES) to analyse a sample (100) arranged on a sample holder (102) of the AES. The controller (316) is configured to receive a measurement of at least one test parameter indicative of the arrangement of t...
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| creator | MAULAZ TONY FARKAS ROMAIN |
| description | A controller (316) and method for establishing safe operation of an atomic emission spectrometer (AES) to analyse a sample (100) arranged on a sample holder (102) of the AES. The controller (316) is configured to receive a measurement of at least one test parameter indicative of the arrangement of the sample (100) on the sample holder (102). The at least one test parameter is then compared to a range of target values for that test parameter to determine if the sample (100) is arranged correctly on the sample holder (102). The test parameters may include an electrical parameter dependant on a current between a first and a second terminal at the sample holder (102), gas pressure in a gas chamber housing an electrode of the AES, or displacement of a portion of the sample holder.
种用于建立原子发射光谱仪(AES)的安全操作以分析布置在所述AES的样品固持器(102)上的样品(100)的控制器(316)和方法。所述控制器(316)经配置以接收指示所述样品(100)在所述样品固持器(102)上的布置的至少个测试参数的测量值。接着比较所述至少个测试参数与所述测试参数的目标值范围以确定所述样品(100)是否正确地布置在所述样品固持器(102)上。所述测试参数可以包含取决于所述样品固持器(102)处的第端子与第二端子之间的电流的电参数、容纳所述AES的电 |
| format | Patent |
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种用于建立原子发射光谱仪(AES)的安全操作以分析布置在所述AES的样品固持器(102)上的样品(100)的控制器(316)和方法。所述控制器(316)经配置以接收指示所述样品(100)在所述样品固持器(102)上的布置的至少个测试参数的测量值。接着比较所述至少个测试参数与所述测试参数的目标值范围以确定所述样品(100)是否正确地布置在所述样品固持器(102)上。所述测试参数可以包含取决于所述样品固持器(102)处的第端子与第二端子之间的电流的电参数、容纳所述AES的电</description><language>chi ; eng</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171121&DB=EPODOC&CC=CN&NR=107371377A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171121&DB=EPODOC&CC=CN&NR=107371377A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MAULAZ TONY</creatorcontrib><creatorcontrib>FARKAS ROMAIN</creatorcontrib><title>Apparatus and method for controlling an atomic emission spectrometer</title><description>A controller (316) and method for establishing safe operation of an atomic emission spectrometer (AES) to analyse a sample (100) arranged on a sample holder (102) of the AES. The controller (316) is configured to receive a measurement of at least one test parameter indicative of the arrangement of the sample (100) on the sample holder (102). The at least one test parameter is then compared to a range of target values for that test parameter to determine if the sample (100) is arranged correctly on the sample holder (102). The test parameters may include an electrical parameter dependant on a current between a first and a second terminal at the sample holder (102), gas pressure in a gas chamber housing an electrode of the AES, or displacement of a portion of the sample holder.
种用于建立原子发射光谱仪(AES)的安全操作以分析布置在所述AES的样品固持器(102)上的样品(100)的控制器(316)和方法。所述控制器(316)经配置以接收指示所述样品(100)在所述样品固持器(102)上的布置的至少个测试参数的测量值。接着比较所述至少个测试参数与所述测试参数的目标值范围以确定所述样品(100)是否正确地布置在所述样品固持器(102)上。所述测试参数可以包含取决于所述样品固持器(102)处的第端子与第二端子之间的电流的电参数、容纳所述AES的电</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNizEOwjAMALMwIOAP5gFIVBkyVwXExMReWakLkZLYis3_ycADmG64u627jCLY0D4KWBcoZG9eYOUGkas1zjnVV1eAxiVFoJJUE1dQodh9H6jt3WbFrHT4ceeOt-tzup9IeCYVjFTJ5ukxnIMPgw9h9P80X-kwM1o</recordid><startdate>20171121</startdate><enddate>20171121</enddate><creator>MAULAZ TONY</creator><creator>FARKAS ROMAIN</creator><scope>EVB</scope></search><sort><creationdate>20171121</creationdate><title>Apparatus and method for controlling an atomic emission spectrometer</title><author>MAULAZ TONY ; FARKAS ROMAIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN107371377A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2017</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MAULAZ TONY</creatorcontrib><creatorcontrib>FARKAS ROMAIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MAULAZ TONY</au><au>FARKAS ROMAIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and method for controlling an atomic emission spectrometer</title><date>2017-11-21</date><risdate>2017</risdate><abstract>A controller (316) and method for establishing safe operation of an atomic emission spectrometer (AES) to analyse a sample (100) arranged on a sample holder (102) of the AES. The controller (316) is configured to receive a measurement of at least one test parameter indicative of the arrangement of the sample (100) on the sample holder (102). The at least one test parameter is then compared to a range of target values for that test parameter to determine if the sample (100) is arranged correctly on the sample holder (102). The test parameters may include an electrical parameter dependant on a current between a first and a second terminal at the sample holder (102), gas pressure in a gas chamber housing an electrode of the AES, or displacement of a portion of the sample holder.
种用于建立原子发射光谱仪(AES)的安全操作以分析布置在所述AES的样品固持器(102)上的样品(100)的控制器(316)和方法。所述控制器(316)经配置以接收指示所述样品(100)在所述样品固持器(102)上的布置的至少个测试参数的测量值。接着比较所述至少个测试参数与所述测试参数的目标值范围以确定所述样品(100)是否正确地布置在所述样品固持器(102)上。所述测试参数可以包含取决于所述样品固持器(102)处的第端子与第二端子之间的电流的电参数、容纳所述AES的电</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | Apparatus and method for controlling an atomic emission spectrometer |
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