Sample fixing platform and freeze scanning electron microscope containing same
The invention relates to the technical field of sample fixing devices, and specifically relates to a sample fixing platform. The sample fixing platform comprises a base and a cylinder arranged on the base, wherein a plurality of sample placing positions are arranged at the upper end of the cylinder;...
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| creator | TIAN YANBAO |
| description | The invention relates to the technical field of sample fixing devices, and specifically relates to a sample fixing platform. The sample fixing platform comprises a base and a cylinder arranged on the base, wherein a plurality of sample placing positions are arranged at the upper end of the cylinder; and fixing parts for fixing samples are arranged on the sample placing positions. The invention also relates to a freeze scanning electron microscope containing the sample fixing platform. According to the sample fixing platform and the freeze scanning electron microscope containing the sample fixing platform provided by the invention, a plurality of fixing parts are arranged at the upper end of the cylinder, and a plurality of samples such as blades can be fixed simultaneously, so that the consumed time for experiments is short, the experiment efficiency is greatly improved, and the economic cost in the experimental process is also reduced.
本发明涉及样品固定装置技术领域，具体涉及了种样品固定台，包括：底座和设置于底座上的柱体，柱体上端设置多个样品放置位，样品放置位上设置用以固定样品的 |
| format | Patent |
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本发明涉及样品固定装置技术领域，具体涉及了种样品固定台，包括：底座和设置于底座上的柱体，柱体上端设置多个样品放置位，样品放置位上设置用以固定样品的</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170922&DB=EPODOC&CC=CN&NR=107195520A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170922&DB=EPODOC&CC=CN&NR=107195520A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TIAN YANBAO</creatorcontrib><title>Sample fixing platform and freeze scanning electron microscope containing same</title><description>The invention relates to the technical field of sample fixing devices, and specifically relates to a sample fixing platform. The sample fixing platform comprises a base and a cylinder arranged on the base, wherein a plurality of sample placing positions are arranged at the upper end of the cylinder; and fixing parts for fixing samples are arranged on the sample placing positions. The invention also relates to a freeze scanning electron microscope containing the sample fixing platform. According to the sample fixing platform and the freeze scanning electron microscope containing the sample fixing platform provided by the invention, a plurality of fixing parts are arranged at the upper end of the cylinder, and a plurality of samples such as blades can be fixed simultaneously, so that the consumed time for experiments is short, the experiment efficiency is greatly improved, and the economic cost in the experimental process is also reduced.
本发明涉及样品固定装置技术领域，具体涉及了种样品固定台，包括：底座和设置于底座上的柱体，柱体上端设置多个样品放置位，样品放置位上设置用以固定样品的</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEKAjEQRuFtLES9w3gAYVdZxFIWxWob7Zdh_COBZCYkKcTTi-IBrF7xvXkzXjmmAHL-6fVBKXB1liOx3sll4AUqwqofRIDUbErRS7YilkBiWtl_uXDEspk5DgWrXxfN-ny6DZcNkk0oiQWKOg1j1-67Q99v2-Pun-cNTZk3Ag</recordid><startdate>20170922</startdate><enddate>20170922</enddate><creator>TIAN YANBAO</creator><scope>EVB</scope></search><sort><creationdate>20170922</creationdate><title>Sample fixing platform and freeze scanning electron microscope containing same</title><author>TIAN YANBAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN107195520A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TIAN YANBAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TIAN YANBAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sample fixing platform and freeze scanning electron microscope containing same</title><date>2017-09-22</date><risdate>2017</risdate><abstract>The invention relates to the technical field of sample fixing devices, and specifically relates to a sample fixing platform. The sample fixing platform comprises a base and a cylinder arranged on the base, wherein a plurality of sample placing positions are arranged at the upper end of the cylinder; and fixing parts for fixing samples are arranged on the sample placing positions. The invention also relates to a freeze scanning electron microscope containing the sample fixing platform. According to the sample fixing platform and the freeze scanning electron microscope containing the sample fixing platform provided by the invention, a plurality of fixing parts are arranged at the upper end of the cylinder, and a plurality of samples such as blades can be fixed simultaneously, so that the consumed time for experiments is short, the experiment efficiency is greatly improved, and the economic cost in the experimental process is also reduced.
本发明涉及样品固定装置技术领域，具体涉及了种样品固定台，包括：底座和设置于底座上的柱体，柱体上端设置多个样品放置位，样品放置位上设置用以固定样品的</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Sample fixing platform and freeze scanning electron microscope containing same |
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