Thin film thermal conductivity measuring system based on micro-nano fluorescent particles

The invention provides a thin film thermal conductivity measuring system based on micro-nano fluorescent particles. The measuring system at least comprises a sample structure module, an imaging light path module and a laser emission and spectrum measurement module. The sample structure module at lea...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHANG WUKANG, FANG XIAOHONG, LI DONGDONG, CHEN XIAOYUAN, CHEN HAIYAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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