Main loop resistance testing method for 1000-kilovolt GIS
The invention discloses a main loop resistance testing method for 1000-kilovolt GIS. The method comprises the steps of connecting a current injection end anode and a voltage detecting end anode of a testing device with a lead phase head end; connecting a voltage detecting end cathode of the testing...
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creator | XI CHENGYUAN LI CHENG DENG HUI QU GANGJU ZHANG ZEYU YANG JIAN YANG XIONG YAN CHENG |
description | The invention discloses a main loop resistance testing method for 1000-kilovolt GIS. The method comprises the steps of connecting a current injection end anode and a voltage detecting end anode of a testing device with a lead phase head end; connecting a voltage detecting end cathode of the testing device with a lead phase end; shorting a conductive-phase metal closing layer at the end; connecting the current injection end cathode of the testing device with a segment connecting part which is closest to the head end of the lead phase; acquiring testing voltage and calculating resistance. According to the main loop resistance testing method for the 1000-kilovolt GIS, through using a metal closing layer outside the main loop of the tested 1000-kilovolt GIS as a conductor for measuring the circuit resistance, the testing method is not affected by length of the tested equipment, and furthermore the number of a large number of large-diameter testing conductors is reduced, thereby realizing low cost. The main loop r |
format | Patent |
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The method comprises the steps of connecting a current injection end anode and a voltage detecting end anode of a testing device with a lead phase head end; connecting a voltage detecting end cathode of the testing device with a lead phase end; shorting a conductive-phase metal closing layer at the end; connecting the current injection end cathode of the testing device with a segment connecting part which is closest to the head end of the lead phase; acquiring testing voltage and calculating resistance. According to the main loop resistance testing method for the 1000-kilovolt GIS, through using a metal closing layer outside the main loop of the tested 1000-kilovolt GIS as a conductor for measuring the circuit resistance, the testing method is not affected by length of the tested equipment, and furthermore the number of a large number of large-diameter testing conductors is reduced, thereby realizing low cost. 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The method comprises the steps of connecting a current injection end anode and a voltage detecting end anode of a testing device with a lead phase head end; connecting a voltage detecting end cathode of the testing device with a lead phase end; shorting a conductive-phase metal closing layer at the end; connecting the current injection end cathode of the testing device with a segment connecting part which is closest to the head end of the lead phase; acquiring testing voltage and calculating resistance. According to the main loop resistance testing method for the 1000-kilovolt GIS, through using a metal closing layer outside the main loop of the tested 1000-kilovolt GIS as a conductor for measuring the circuit resistance, the testing method is not affected by length of the tested equipment, and furthermore the number of a large number of large-diameter testing conductors is reduced, thereby realizing low cost. 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The method comprises the steps of connecting a current injection end anode and a voltage detecting end anode of a testing device with a lead phase head end; connecting a voltage detecting end cathode of the testing device with a lead phase end; shorting a conductive-phase metal closing layer at the end; connecting the current injection end cathode of the testing device with a segment connecting part which is closest to the head end of the lead phase; acquiring testing voltage and calculating resistance. According to the main loop resistance testing method for the 1000-kilovolt GIS, through using a metal closing layer outside the main loop of the tested 1000-kilovolt GIS as a conductor for measuring the circuit resistance, the testing method is not affected by length of the tested equipment, and furthermore the number of a large number of large-diameter testing conductors is reduced, thereby realizing low cost. The main loop r</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Main loop resistance testing method for 1000-kilovolt GIS |
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