Modular micro optic device for optical probe

The invention relates to a modular micro optic device for an optical probe. Some embodiments of the invention include a probe body (61) of an optical probe assembly (60). The probe assembly (60) may be designed for measuring a surface of an object while being carried by a probe head of a coordinate...

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Hauptverfasser: ALEXANDRE PADUCH, THOMAS JENSEN
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creator ALEXANDRE PADUCH
THOMAS JENSEN
description The invention relates to a modular micro optic device for an optical probe. Some embodiments of the invention include a probe body (61) of an optical probe assembly (60). The probe assembly (60) may be designed for measuring a surface of an object while being carried by a probe head of a coordinate measuring machine. The probe body comprises a coupling unit at a first end of the probe body (60) designed for providing coupling of the probe body to the probe head of a coordinate measuring machine and a light guiding element (62) for transmitting original source light supplied by the probe head from the coupling unit to a second end of the probe body. The probe body (61) comprises a micro-optical device probe interface (66) located at the second end of the probe body (11, 61), and the probe interface (66) comprises a source light emitting element (65) providing the emission of the original source light with respect to the second end in a defined direction. 本发明涉及用于光学探针的模块化微光学器件。种光学探针组件(60)的探针本体(61),该探针组件(60)被设计成用
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN106907989A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN106907989A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN106907989A3</originalsourceid><addsrcrecordid>eNrjZNDxzU8pzUksUsjNTC7KV8gvKMlMVkhJLctMTlVIyy-CCCTmKBQU5Sel8jCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_QwMzSwNzSwtLR2Ni1AAAhOspvQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Modular micro optic device for optical probe</title><source>esp@cenet</source><creator>ALEXANDRE PADUCH ; THOMAS JENSEN</creator><creatorcontrib>ALEXANDRE PADUCH ; THOMAS JENSEN</creatorcontrib><description>The invention relates to a modular micro optic device for an optical probe. Some embodiments of the invention include a probe body (61) of an optical probe assembly (60). The probe assembly (60) may be designed for measuring a surface of an object while being carried by a probe head of a coordinate measuring machine. The probe body comprises a coupling unit at a first end of the probe body (60) designed for providing coupling of the probe body to the probe head of a coordinate measuring machine and a light guiding element (62) for transmitting original source light supplied by the probe head from the coupling unit to a second end of the probe body. The probe body (61) comprises a micro-optical device probe interface (66) located at the second end of the probe body (11, 61), and the probe interface (66) comprises a source light emitting element (65) providing the emission of the original source light with respect to the second end in a defined direction. 本发明涉及用于光学探针的模块化微光学器件。种光学探针组件(60)的探针本体(61),该探针组件(60)被设计成用</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170630&amp;DB=EPODOC&amp;CC=CN&amp;NR=106907989A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170630&amp;DB=EPODOC&amp;CC=CN&amp;NR=106907989A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ALEXANDRE PADUCH</creatorcontrib><creatorcontrib>THOMAS JENSEN</creatorcontrib><title>Modular micro optic device for optical probe</title><description>The invention relates to a modular micro optic device for an optical probe. Some embodiments of the invention include a probe body (61) of an optical probe assembly (60). The probe assembly (60) may be designed for measuring a surface of an object while being carried by a probe head of a coordinate measuring machine. The probe body comprises a coupling unit at a first end of the probe body (60) designed for providing coupling of the probe body to the probe head of a coordinate measuring machine and a light guiding element (62) for transmitting original source light supplied by the probe head from the coupling unit to a second end of the probe body. The probe body (61) comprises a micro-optical device probe interface (66) located at the second end of the probe body (11, 61), and the probe interface (66) comprises a source light emitting element (65) providing the emission of the original source light with respect to the second end in a defined direction. 本发明涉及用于光学探针的模块化微光学器件。种光学探针组件(60)的探针本体(61),该探针组件(60)被设计成用</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDxzU8pzUksUsjNTC7KV8gvKMlMVkhJLctMTlVIyy-CCCTmKBQU5Sel8jCwpiXmFKfyQmluBkU31xBnD93Ugvz41OKCxOTUvNSSeGc_QwMzSwNzSwtLR2Ni1AAAhOspvQ</recordid><startdate>20170630</startdate><enddate>20170630</enddate><creator>ALEXANDRE PADUCH</creator><creator>THOMAS JENSEN</creator><scope>EVB</scope></search><sort><creationdate>20170630</creationdate><title>Modular micro optic device for optical probe</title><author>ALEXANDRE PADUCH ; THOMAS JENSEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN106907989A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2017</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ALEXANDRE PADUCH</creatorcontrib><creatorcontrib>THOMAS JENSEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ALEXANDRE PADUCH</au><au>THOMAS JENSEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Modular micro optic device for optical probe</title><date>2017-06-30</date><risdate>2017</risdate><abstract>The invention relates to a modular micro optic device for an optical probe. Some embodiments of the invention include a probe body (61) of an optical probe assembly (60). The probe assembly (60) may be designed for measuring a surface of an object while being carried by a probe head of a coordinate measuring machine. The probe body comprises a coupling unit at a first end of the probe body (60) designed for providing coupling of the probe body to the probe head of a coordinate measuring machine and a light guiding element (62) for transmitting original source light supplied by the probe head from the coupling unit to a second end of the probe body. The probe body (61) comprises a micro-optical device probe interface (66) located at the second end of the probe body (11, 61), and the probe interface (66) comprises a source light emitting element (65) providing the emission of the original source light with respect to the second end in a defined direction. 本发明涉及用于光学探针的模块化微光学器件。种光学探针组件(60)的探针本体(61),该探针组件(60)被设计成用</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Modular micro optic device for optical probe
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T09%3A13%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ALEXANDRE%20PADUCH&rft.date=2017-06-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN106907989A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true