Method for predicting melt parameters

The present invention provides a method for predicting melt parameters. The method is suitable for use in a long crystal process. The method comprises the steps of collecting a plurality of melt height data at a plurality of original time points during a melting process of a previous long crystal pr...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YANG CHENG JUI, SANG HUIMIN, HSU SUNG LIN, LIU YOUQUN, YANG YUMIN, YU WENHUAI, LUO QISHAO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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