Height gauge
The invention relates to the field of a mechanical mapping apparatus and particularly relates to a height gauge. The height gauge comprises a foundation and a main gauge fixedly arranged on the foundation, wherein the main gauge is movably equipped with a vernier gauge in a guiding mode, the height...
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| creator | LI FUMING JI SHUAI FENG SHUO XIAO XINCHEN SUN QING ZHANG ZIMING WANG YAQI |
| description | The invention relates to the field of a mechanical mapping apparatus and particularly relates to a height gauge. The height gauge comprises a foundation and a main gauge fixedly arranged on the foundation, wherein the main gauge is movably equipped with a vernier gauge in a guiding mode, the height gauge further comprises a secondary gauge which is movably assembled on the main gauge in a guiding mode, guiding moving directions of the secondary gauge and the main gauge are consistent, the secondary gauge is provided with a secondary gauge scale, the vernier gauge is provided with a secondary gauge vernier scale corresponding to the secondary gauge scale, and the height gauge further comprises a locking members used for locking and fixing the secondary gauge and the main gauge. The height gauge is advantaged in that the secondary gauge is directly assembled on the main gauge, the secondary gauge and the main gauge are directly matched, so control on assembling precision in a manufacturing process can be facili |
| format | Patent |
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The height gauge comprises a foundation and a main gauge fixedly arranged on the foundation, wherein the main gauge is movably equipped with a vernier gauge in a guiding mode, the height gauge further comprises a secondary gauge which is movably assembled on the main gauge in a guiding mode, guiding moving directions of the secondary gauge and the main gauge are consistent, the secondary gauge is provided with a secondary gauge scale, the vernier gauge is provided with a secondary gauge vernier scale corresponding to the secondary gauge scale, and the height gauge further comprises a locking members used for locking and fixing the secondary gauge and the main gauge. 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The height gauge comprises a foundation and a main gauge fixedly arranged on the foundation, wherein the main gauge is movably equipped with a vernier gauge in a guiding mode, the height gauge further comprises a secondary gauge which is movably assembled on the main gauge in a guiding mode, guiding moving directions of the secondary gauge and the main gauge are consistent, the secondary gauge is provided with a secondary gauge scale, the vernier gauge is provided with a secondary gauge vernier scale corresponding to the secondary gauge scale, and the height gauge further comprises a locking members used for locking and fixing the secondary gauge and the main gauge. The height gauge is advantaged in that the secondary gauge is directly assembled on the main gauge, the secondary gauge and the main gauge are directly matched, so control on assembling precision in a manufacturing process can be facili</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN106546151A |
| source | esp@cenet |
| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Height gauge |
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