HIGH THROUGHPUT HOT TESTING METHOD AND SYSTEM FOR HIGH BRIGHTNESS LIGHT EMITTING DIODES

The invention relates to a high throughput hot testing method and a system for high brightness light emitting diodes. A method of performing a hot test of a wafer-level, packaged high-brightness phosphor converted light-emitting diode includes selectively heating portions of the phosphor layer using...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SOLARZ RICHARD
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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