Single parameter event sequence testing data generation method of embedded software
The invention discloses a single parameter event sequence testing data generation method of embedded software, relates to a testing data generation method of embedded software, and aims to solve the problems that the time sequence of data is not taken into account in a conventional embedded software...
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| creator | WEI ZHANGAN SUN CHAO JIANG SHOUDA SHENG YUNLONG |
| description | The invention discloses a single parameter event sequence testing data generation method of embedded software, relates to a testing data generation method of embedded software, and aims to solve the problems that the time sequence of data is not taken into account in a conventional embedded software testing system testing data generation method and the testing data are very large. The method comprises the following steps: firstly, generating an initial interaction set Q containing all t-dimensional events, wherein an initial testing data cover vector V is empty; randomly selecting one candidate t-dimensional event interaction from Q, adding into the testing data cover vector V, and deleting the t-dimensional event interaction from Q at the same time; adding a t-dimensional event interaction with the largest adaptive value in Q into the tail of the vector V, and deleting t-dimensional event interactions covered by a vector U from Q; till Q is empty, outputting the testing data cover vector V, and thus the data |
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The method comprises the following steps: firstly, generating an initial interaction set Q containing all t-dimensional events, wherein an initial testing data cover vector V is empty; randomly selecting one candidate t-dimensional event interaction from Q, adding into the testing data cover vector V, and deleting the t-dimensional event interaction from Q at the same time; adding a t-dimensional event interaction with the largest adaptive value in Q into the tail of the vector V, and deleting t-dimensional event interactions covered by a vector U from Q; till Q is empty, outputting the testing data cover vector V, and thus the data</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161109&DB=EPODOC&CC=CN&NR=106095692A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161109&DB=EPODOC&CC=CN&NR=106095692A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WEI ZHANGAN</creatorcontrib><creatorcontrib>SUN CHAO</creatorcontrib><creatorcontrib>JIANG SHOUDA</creatorcontrib><creatorcontrib>SHENG YUNLONG</creatorcontrib><title>Single parameter event sequence testing data generation method of embedded software</title><description>The invention discloses a single parameter event sequence testing data generation method of embedded software, relates to a testing data generation method of embedded software, and aims to solve the problems that the time sequence of data is not taken into account in a conventional embedded software testing system testing data generation method and the testing data are very large. The method comprises the following steps: firstly, generating an initial interaction set Q containing all t-dimensional events, wherein an initial testing data cover vector V is empty; randomly selecting one candidate t-dimensional event interaction from Q, adding into the testing data cover vector V, and deleting the t-dimensional event interaction from Q at the same time; adding a t-dimensional event interaction with the largest adaptive value in Q into the tail of the vector V, and deleting t-dimensional event interactions covered by a vector U from Q; till Q is empty, outputting the testing data cover vector V, and thus the data</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzDEKwkAQRuFtLES9w3gAISoGUkpQrGxiH8bsvzGQzK67o17fLTyA1Ws-3tw0zSD9CAoceYIiEt4QpYTnC9KBFEkzIcvK1EMQWQcvlPHDW_KOMN1hLSwl7_TDEUszczwmrH5dmPX5dKsvGwTfIgXu8kbb-rotyqI6lNXuuP_HfAGJXjjT</recordid><startdate>20161109</startdate><enddate>20161109</enddate><creator>WEI ZHANGAN</creator><creator>SUN CHAO</creator><creator>JIANG SHOUDA</creator><creator>SHENG YUNLONG</creator><scope>EVB</scope></search><sort><creationdate>20161109</creationdate><title>Single parameter event sequence testing data generation method of embedded software</title><author>WEI ZHANGAN ; SUN CHAO ; JIANG SHOUDA ; SHENG YUNLONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN106095692A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2016</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>WEI ZHANGAN</creatorcontrib><creatorcontrib>SUN CHAO</creatorcontrib><creatorcontrib>JIANG SHOUDA</creatorcontrib><creatorcontrib>SHENG YUNLONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WEI ZHANGAN</au><au>SUN CHAO</au><au>JIANG SHOUDA</au><au>SHENG YUNLONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Single parameter event sequence testing data generation method of embedded software</title><date>2016-11-09</date><risdate>2016</risdate><abstract>The invention discloses a single parameter event sequence testing data generation method of embedded software, relates to a testing data generation method of embedded software, and aims to solve the problems that the time sequence of data is not taken into account in a conventional embedded software testing system testing data generation method and the testing data are very large. The method comprises the following steps: firstly, generating an initial interaction set Q containing all t-dimensional events, wherein an initial testing data cover vector V is empty; randomly selecting one candidate t-dimensional event interaction from Q, adding into the testing data cover vector V, and deleting the t-dimensional event interaction from Q at the same time; adding a t-dimensional event interaction with the largest adaptive value in Q into the tail of the vector V, and deleting t-dimensional event interactions covered by a vector U from Q; till Q is empty, outputting the testing data cover vector V, and thus the data</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Single parameter event sequence testing data generation method of embedded software |
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