A light spot combined target characteristic determination method

The invention discloses a light spot combined target characteristic determination method. Compared with methods in the prior art, the invention brings forward a vertical wave beam formation method, i.e., the method not only carries out horizontal wave beam formation on array elements, but also carri...

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Hauptverfasser: WANG CHUNHUI, SUN XIAOLONG, ZHENG KAI, ZHANG TINGBEI, LIU JIANTAO, JI ZHONGSHUN, WU JIANGUO, MA XUEYU, SONG HONGLING, BAO HAIGE, SHI XIN, ZHANG LI, CAO ZHENG, ZHANG JIBEI, ZHANG DAN, HE TAO, XU GENRONG, BAI LU, PANG RAN, SONG SHULIANG, ZHANG ZONGKE, TANG SIMING, ZHANG YUAN, DU ZHANJUN, SHAO XIU
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a light spot combined target characteristic determination method. Compared with methods in the prior art, the invention brings forward a vertical wave beam formation method, i.e., the method not only carries out horizontal wave beam formation on array elements, but also carries out vertical wave beam formation before the horizontal wave beam formation, so that a target incident angle can be considered in a three-dimensional more and characteristic analysis can be carried out in a multi-angle and multi-target mode. Furthermore, the method of the invention carries out combined display of LOFAR spectrum data and DEMON spectrum data so as to make up problems of insufficient capability of the LOFAR spectrum data in low band detection. 本发明公开了种光点联合判断目标特性的方法。本发明相对于现有技术来说,本发明提出垂直波束形成的方法,即本发明不仅对各阵元做水平波束形成,还在做水平波束形成前做垂直波束形成,这样来,能够三维的考虑目标入射角度,便于多角度多目标进行特性分析。此外,本发明对LOFAR谱数据和DEMON谱数据进行联合显示,弥补了LOFAR谱数据在低频段检测能力的不足的问题。