Method and device for diagnosing faults
The invention discloses a method and device for diagnosing faults. The method includes the steps that fault diagnosis models corresponding to various fault types are built through a support vector machine (SVM) based on history fault data corresponding to the various fault types of target products;...
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| creator | CHEN LIUDAN LI GUOMING YIN HONG YAN XIANGTAO FAN YU |
| description | The invention discloses a method and device for diagnosing faults. The method includes the steps that fault diagnosis models corresponding to various fault types are built through a support vector machine (SVM) based on history fault data corresponding to the various fault types of target products; data generated in the running process of the target products is obtained, the obtained data is subjected to fault diagnosis based on the fault diagnosis models corresponding to the various fault types, and decision values of the various fault types corresponding to the obtained data are obtained; the fault types of the target products are determined based on preset weight values of the fault types and the decision values of the fault types corresponding to the obtained data. Compared with the prior art, according to the method and device for diagnosing faults, the fault diagnosis models corresponding to the fault types of the products are built through the SVM, the fault types of the products are finally determined |
| format | Patent |
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The method includes the steps that fault diagnosis models corresponding to various fault types are built through a support vector machine (SVM) based on history fault data corresponding to the various fault types of target products; data generated in the running process of the target products is obtained, the obtained data is subjected to fault diagnosis based on the fault diagnosis models corresponding to the various fault types, and decision values of the various fault types corresponding to the obtained data are obtained; the fault types of the target products are determined based on preset weight values of the fault types and the decision values of the fault types corresponding to the obtained data. 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The method includes the steps that fault diagnosis models corresponding to various fault types are built through a support vector machine (SVM) based on history fault data corresponding to the various fault types of target products; data generated in the running process of the target products is obtained, the obtained data is subjected to fault diagnosis based on the fault diagnosis models corresponding to the various fault types, and decision values of the various fault types corresponding to the obtained data are obtained; the fault types of the target products are determined based on preset weight values of the fault types and the decision values of the fault types corresponding to the obtained data. 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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Method and device for diagnosing faults |
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