Method for measuring deflection and its convenient measuring instrument for deflection
The invention discloses a method for measuring deflection and its convenient measuring instrument for deflection. When a dial indicator or a micrometer is used to measure the deflection of a component to be measured, the central part at the bottom of the dial indicator or the micrometer is provided...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | XU BUZHOU ZHONG ANXIN ZHANG HAO |
| description | The invention discloses a method for measuring deflection and its convenient measuring instrument for deflection. When a dial indicator or a micrometer is used to measure the deflection of a component to be measured, the central part at the bottom of the dial indicator or the micrometer is provided with a table tip, and the two sides of the dial indicator or the micrometer are provided with an adjustable arm whose length can be adjusted. The front end of each adjustable arm is provided with a foot. When the measuring instrument is in use, the two feet are closely attached to the surface of the component to be measured or the vertical rod part and the table tip at the central part of the dial indicator or the micrometer abuts closely against the flat surface or the vertical rod of the component to be measured. When the length distance between two feet is L and the number indicated by the dial indicator or the micrometer is V, then the deflection of the component can be obtained as V. According to the invention |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN106017291A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN106017291A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN106017291A3</originalsourceid><addsrcrecordid>eNrjZAjzTS3JyE9RSMsvUshNTSwuLcrMS1dISU3LSU0uyczPU0jMS1HILClWSM7PK0vNy0zNK0FSl5lXXFJUmgsSBBmA0MbDwJqWmFOcyguluRkU3VxDnD10Uwvy41OLCxKTU_NSS-Kd_QwNzAwMzY0sDR2NiVEDAHF3Okc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for measuring deflection and its convenient measuring instrument for deflection</title><source>esp@cenet</source><creator>XU BUZHOU ; ZHONG ANXIN ; ZHANG HAO</creator><creatorcontrib>XU BUZHOU ; ZHONG ANXIN ; ZHANG HAO</creatorcontrib><description>The invention discloses a method for measuring deflection and its convenient measuring instrument for deflection. When a dial indicator or a micrometer is used to measure the deflection of a component to be measured, the central part at the bottom of the dial indicator or the micrometer is provided with a table tip, and the two sides of the dial indicator or the micrometer are provided with an adjustable arm whose length can be adjusted. The front end of each adjustable arm is provided with a foot. When the measuring instrument is in use, the two feet are closely attached to the surface of the component to be measured or the vertical rod part and the table tip at the central part of the dial indicator or the micrometer abuts closely against the flat surface or the vertical rod of the component to be measured. When the length distance between two feet is L and the number indicated by the dial indicator or the micrometer is V, then the deflection of the component can be obtained as V. According to the invention</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161012&DB=EPODOC&CC=CN&NR=106017291A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161012&DB=EPODOC&CC=CN&NR=106017291A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XU BUZHOU</creatorcontrib><creatorcontrib>ZHONG ANXIN</creatorcontrib><creatorcontrib>ZHANG HAO</creatorcontrib><title>Method for measuring deflection and its convenient measuring instrument for deflection</title><description>The invention discloses a method for measuring deflection and its convenient measuring instrument for deflection. When a dial indicator or a micrometer is used to measure the deflection of a component to be measured, the central part at the bottom of the dial indicator or the micrometer is provided with a table tip, and the two sides of the dial indicator or the micrometer are provided with an adjustable arm whose length can be adjusted. The front end of each adjustable arm is provided with a foot. When the measuring instrument is in use, the two feet are closely attached to the surface of the component to be measured or the vertical rod part and the table tip at the central part of the dial indicator or the micrometer abuts closely against the flat surface or the vertical rod of the component to be measured. When the length distance between two feet is L and the number indicated by the dial indicator or the micrometer is V, then the deflection of the component can be obtained as V. According to the invention</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAjzTS3JyE9RSMsvUshNTSwuLcrMS1dISU3LSU0uyczPU0jMS1HILClWSM7PK0vNy0zNK0FSl5lXXFJUmgsSBBmA0MbDwJqWmFOcyguluRkU3VxDnD10Uwvy41OLCxKTU_NSS-Kd_QwNzAwMzY0sDR2NiVEDAHF3Okc</recordid><startdate>20161012</startdate><enddate>20161012</enddate><creator>XU BUZHOU</creator><creator>ZHONG ANXIN</creator><creator>ZHANG HAO</creator><scope>EVB</scope></search><sort><creationdate>20161012</creationdate><title>Method for measuring deflection and its convenient measuring instrument for deflection</title><author>XU BUZHOU ; ZHONG ANXIN ; ZHANG HAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN106017291A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2016</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XU BUZHOU</creatorcontrib><creatorcontrib>ZHONG ANXIN</creatorcontrib><creatorcontrib>ZHANG HAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XU BUZHOU</au><au>ZHONG ANXIN</au><au>ZHANG HAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for measuring deflection and its convenient measuring instrument for deflection</title><date>2016-10-12</date><risdate>2016</risdate><abstract>The invention discloses a method for measuring deflection and its convenient measuring instrument for deflection. When a dial indicator or a micrometer is used to measure the deflection of a component to be measured, the central part at the bottom of the dial indicator or the micrometer is provided with a table tip, and the two sides of the dial indicator or the micrometer are provided with an adjustable arm whose length can be adjusted. The front end of each adjustable arm is provided with a foot. When the measuring instrument is in use, the two feet are closely attached to the surface of the component to be measured or the vertical rod part and the table tip at the central part of the dial indicator or the micrometer abuts closely against the flat surface or the vertical rod of the component to be measured. When the length distance between two feet is L and the number indicated by the dial indicator or the micrometer is V, then the deflection of the component can be obtained as V. According to the invention</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN106017291A |
| source | esp@cenet |
| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Method for measuring deflection and its convenient measuring instrument for deflection |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T11%3A51%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=XU%20BUZHOU&rft.date=2016-10-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN106017291A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |