Locating device used for target location of different microscopes and locating method thereof
The invention provides a locating device used for target location of different microscopes and a locating method thereof. The device comprises a locating glass slide and a multicolor strip scale plate. The multicolor strip scale plate is fixed on one main surface of the locating glass slide. The mul...
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creator | Wu Weiwei Lou Jingwei Chen Debo Zhang Zhenzhen Zhou Fuyou Xu Cheng Wang Congren Lou Pengrong |
description | The invention provides a locating device used for target location of different microscopes and a locating method thereof. The device comprises a locating glass slide and a multicolor strip scale plate. The multicolor strip scale plate is fixed on one main surface of the locating glass slide. The multicolor strip scale plate is provided with one or multiple scale identification areas. The scale identification areas comprise scale grids formed by main scale marks L1 and multicolor scale marks L2 in a staggered way. With application of the device, a target microscopic cutting area can be converted into concrete reading coordinates so that the target cutting area can be rapidly and accurately located in a laser microscopic cutting system and then the target can be rapidly and accurately searched, and thus laser cutting and other subsequent operation can be accurately performed.
本发明提供了种用于不同显微镜间进行目标定位的定位装置和定位方法。本发明装置包括定位载玻片和多色彩条刻度片,其中所述多色彩条刻度片固定于所述定位载玻片的个主表面上,所述多色彩条刻度片设有个或多个刻度识别区,所述刻度识别区包括由主色刻度线L1和多色刻度线L2交错构成的刻度网格。 |
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本发明提供了种用于不同显微镜间进行目标定位的定位装置和定位方法。本发明装置包括定位载玻片和多色彩条刻度片,其中所述多色彩条刻度片固定于所述定位载玻片的个主表面上,所述多色彩条刻度片设有个或多个刻度识别区,所述刻度识别区包括由主色刻度线L1和多色刻度线L2交错构成的刻度网格。</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160831&DB=EPODOC&CC=CN&NR=105911684A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160831&DB=EPODOC&CC=CN&NR=105911684A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Wu Weiwei</creatorcontrib><creatorcontrib>Lou Jingwei</creatorcontrib><creatorcontrib>Chen Debo</creatorcontrib><creatorcontrib>Zhang Zhenzhen</creatorcontrib><creatorcontrib>Zhou Fuyou</creatorcontrib><creatorcontrib>Xu Cheng</creatorcontrib><creatorcontrib>Wang Congren</creatorcontrib><creatorcontrib>Lou Pengrong</creatorcontrib><title>Locating device used for target location of different microscopes and locating method thereof</title><description>The invention provides a locating device used for target location of different microscopes and a locating method thereof. The device comprises a locating glass slide and a multicolor strip scale plate. The multicolor strip scale plate is fixed on one main surface of the locating glass slide. The multicolor strip scale plate is provided with one or multiple scale identification areas. The scale identification areas comprise scale grids formed by main scale marks L1 and multicolor scale marks L2 in a staggered way. With application of the device, a target microscopic cutting area can be converted into concrete reading coordinates so that the target cutting area can be rapidly and accurately located in a laser microscopic cutting system and then the target can be rapidly and accurately searched, and thus laser cutting and other subsequent operation can be accurately performed.
本发明提供了种用于不同显微镜间进行目标定位的定位装置和定位方法。本发明装置包括定位载玻片和多色彩条刻度片,其中所述多色彩条刻度片固定于所述定位载玻片的个主表面上,所述多色彩条刻度片设有个或多个刻度识别区,所述刻度识别区包括由主色刻度线L1和多色刻度线L2交错构成的刻度网格。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzL0KwjAUxfEsDqK-w_UBBIMf1FGK4iBOrlJCctIG2tyQXH1-i_QBnM7w_3Hm6nVnayTElhw-wYLeBY48ZxKTWwj1v86R2JML3iMjCg3BZi6WEwqZ6CY1vgyQjh1JNzr2SzXzpi9YTbtQ6-vlWd82SNygJGMRIU390NvDSetjtT_v_jFfBew8aA</recordid><startdate>20160831</startdate><enddate>20160831</enddate><creator>Wu Weiwei</creator><creator>Lou Jingwei</creator><creator>Chen Debo</creator><creator>Zhang Zhenzhen</creator><creator>Zhou Fuyou</creator><creator>Xu Cheng</creator><creator>Wang Congren</creator><creator>Lou Pengrong</creator><scope>EVB</scope></search><sort><creationdate>20160831</creationdate><title>Locating device used for target location of different microscopes and locating method thereof</title><author>Wu Weiwei ; Lou Jingwei ; Chen Debo ; Zhang Zhenzhen ; Zhou Fuyou ; Xu Cheng ; Wang Congren ; Lou Pengrong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN105911684A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Wu Weiwei</creatorcontrib><creatorcontrib>Lou Jingwei</creatorcontrib><creatorcontrib>Chen Debo</creatorcontrib><creatorcontrib>Zhang Zhenzhen</creatorcontrib><creatorcontrib>Zhou Fuyou</creatorcontrib><creatorcontrib>Xu Cheng</creatorcontrib><creatorcontrib>Wang Congren</creatorcontrib><creatorcontrib>Lou Pengrong</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wu Weiwei</au><au>Lou Jingwei</au><au>Chen Debo</au><au>Zhang Zhenzhen</au><au>Zhou Fuyou</au><au>Xu Cheng</au><au>Wang Congren</au><au>Lou Pengrong</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Locating device used for target location of different microscopes and locating method thereof</title><date>2016-08-31</date><risdate>2016</risdate><abstract>The invention provides a locating device used for target location of different microscopes and a locating method thereof. The device comprises a locating glass slide and a multicolor strip scale plate. The multicolor strip scale plate is fixed on one main surface of the locating glass slide. The multicolor strip scale plate is provided with one or multiple scale identification areas. The scale identification areas comprise scale grids formed by main scale marks L1 and multicolor scale marks L2 in a staggered way. With application of the device, a target microscopic cutting area can be converted into concrete reading coordinates so that the target cutting area can be rapidly and accurately located in a laser microscopic cutting system and then the target can be rapidly and accurately searched, and thus laser cutting and other subsequent operation can be accurately performed.
本发明提供了种用于不同显微镜间进行目标定位的定位装置和定位方法。本发明装置包括定位载玻片和多色彩条刻度片,其中所述多色彩条刻度片固定于所述定位载玻片的个主表面上,所述多色彩条刻度片设有个或多个刻度识别区,所述刻度识别区包括由主色刻度线L1和多色刻度线L2交错构成的刻度网格。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING |
title | Locating device used for target location of different microscopes and locating method thereof |
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