Test probe, test probe component and test platform

Test probe, test probe component and test platform

A test probe, a test probe component and a test platform. The test probe comprises a probe body (301), wherein an end of the probe body (301) is of a hollow design, thereby cooperating with a gold finger (40) through insertion. The design solves the current technical problems of assembly of a probe...

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1. Verfasser: NIE LINHONG
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator NIE LINHONG
description A test probe, a test probe component and a test platform. The test probe comprises a probe body (301), wherein an end of the probe body (301) is of a hollow design, thereby cooperating with a gold finger (40) through insertion. The design solves the current technical problems of assembly of a probe being relatively difficult, the processing requirements of a through-hole being relatively high, and powering on being unstable.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Test probe, test probe component and test platform
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