Gas-barrier film and process for producing the same

[Problem] To provide a means whereby gas barrier capabilities, and endurance of gas barrier capabilities, of a gas barrier film may be further improved. [Solution] A gas barrier film having: a base material; a first barrier layer situated on at least one surface of the base material, having a film d...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: ITO HIROHIDE
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ITO HIROHIDE
description [Problem] To provide a means whereby gas barrier capabilities, and endurance of gas barrier capabilities, of a gas barrier film may be further improved. [Solution] A gas barrier film having: a base material; a first barrier layer situated on at least one surface of the base material, having a film density of 1.5-2.1 c/m3, and containing an inorganic compound; and a second barrier layer formed on the surface of the base material on the same side where the first barrier layer is formed, and containing silicon atoms, oxygen atoms, and at least one added element from the group consisting of elements of Groups 2-14 of the long form of the periodic table (excluding silicon and carbon), the ratio (O/Si) of oxygen atoms to carbon atoms being 1.4-2.2, and the ratio (N/Si) of nitrogen atoms to carbon atoms being 0-0.4.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN105246683A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN105246683A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN105246683A3</originalsourceid><addsrcrecordid>eNrjZDB2TyzWTUosKspMLVJIy8zJVUjMS1EoKMpPTi0uVkjLLwKxU0qTM_PSFUoyUhWKE3NTeRhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoYGpkYmZmYWxozExagDKCSwC</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Gas-barrier film and process for producing the same</title><source>esp@cenet</source><creator>ITO HIROHIDE</creator><creatorcontrib>ITO HIROHIDE</creatorcontrib><description>[Problem] To provide a means whereby gas barrier capabilities, and endurance of gas barrier capabilities, of a gas barrier film may be further improved. [Solution] A gas barrier film having: a base material; a first barrier layer situated on at least one surface of the base material, having a film density of 1.5-2.1 c/m3, and containing an inorganic compound; and a second barrier layer formed on the surface of the base material on the same side where the first barrier layer is formed, and containing silicon atoms, oxygen atoms, and at least one added element from the group consisting of elements of Groups 2-14 of the long form of the periodic table (excluding silicon and carbon), the ratio (O/Si) of oxygen atoms to carbon atoms being 1.4-2.2, and the ratio (N/Si) of nitrogen atoms to carbon atoms being 0-0.4.</description><language>eng</language><subject>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G ; APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL ; BASIC ELECTRIC ELEMENTS ; CHEMISTRY ; COMPOSITIONS BASED THEREON ; ELECTRIC HEATING ; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; GENERAL PROCESSES OF COMPOUNDING ; LAYERED PRODUCTS ; LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM ; METALLURGY ; ORGANIC MACROMOLECULAR COMPOUNDS ; PERFORMING OPERATIONS ; PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL ; SEMICONDUCTOR DEVICES ; SPRAYING OR ATOMISING IN GENERAL ; THEIR PREPARATION OR CHEMICAL WORKING-UP ; TRANSPORTING ; WORKING-UP</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20160113&amp;DB=EPODOC&amp;CC=CN&amp;NR=105246683A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20160113&amp;DB=EPODOC&amp;CC=CN&amp;NR=105246683A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ITO HIROHIDE</creatorcontrib><title>Gas-barrier film and process for producing the same</title><description>[Problem] To provide a means whereby gas barrier capabilities, and endurance of gas barrier capabilities, of a gas barrier film may be further improved. [Solution] A gas barrier film having: a base material; a first barrier layer situated on at least one surface of the base material, having a film density of 1.5-2.1 c/m3, and containing an inorganic compound; and a second barrier layer formed on the surface of the base material on the same side where the first barrier layer is formed, and containing silicon atoms, oxygen atoms, and at least one added element from the group consisting of elements of Groups 2-14 of the long form of the periodic table (excluding silicon and carbon), the ratio (O/Si) of oxygen atoms to carbon atoms being 1.4-2.2, and the ratio (N/Si) of nitrogen atoms to carbon atoms being 0-0.4.</description><subject>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G</subject><subject>APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMISTRY</subject><subject>COMPOSITIONS BASED THEREON</subject><subject>ELECTRIC HEATING</subject><subject>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>GENERAL PROCESSES OF COMPOUNDING</subject><subject>LAYERED PRODUCTS</subject><subject>LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM</subject><subject>METALLURGY</subject><subject>ORGANIC MACROMOLECULAR COMPOUNDS</subject><subject>PERFORMING OPERATIONS</subject><subject>PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SPRAYING OR ATOMISING IN GENERAL</subject><subject>THEIR PREPARATION OR CHEMICAL WORKING-UP</subject><subject>TRANSPORTING</subject><subject>WORKING-UP</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB2TyzWTUosKspMLVJIy8zJVUjMS1EoKMpPTi0uVkjLLwKxU0qTM_PSFUoyUhWKE3NTeRhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoYGpkYmZmYWxozExagDKCSwC</recordid><startdate>20160113</startdate><enddate>20160113</enddate><creator>ITO HIROHIDE</creator><scope>EVB</scope></search><sort><creationdate>20160113</creationdate><title>Gas-barrier film and process for producing the same</title><author>ITO HIROHIDE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN105246683A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G</topic><topic>APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMISTRY</topic><topic>COMPOSITIONS BASED THEREON</topic><topic>ELECTRIC HEATING</topic><topic>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>GENERAL PROCESSES OF COMPOUNDING</topic><topic>LAYERED PRODUCTS</topic><topic>LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM</topic><topic>METALLURGY</topic><topic>ORGANIC MACROMOLECULAR COMPOUNDS</topic><topic>PERFORMING OPERATIONS</topic><topic>PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SPRAYING OR ATOMISING IN GENERAL</topic><topic>THEIR PREPARATION OR CHEMICAL WORKING-UP</topic><topic>TRANSPORTING</topic><topic>WORKING-UP</topic><toplevel>online_resources</toplevel><creatorcontrib>ITO HIROHIDE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ITO HIROHIDE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Gas-barrier film and process for producing the same</title><date>2016-01-13</date><risdate>2016</risdate><abstract>[Problem] To provide a means whereby gas barrier capabilities, and endurance of gas barrier capabilities, of a gas barrier film may be further improved. [Solution] A gas barrier film having: a base material; a first barrier layer situated on at least one surface of the base material, having a film density of 1.5-2.1 c/m3, and containing an inorganic compound; and a second barrier layer formed on the surface of the base material on the same side where the first barrier layer is formed, and containing silicon atoms, oxygen atoms, and at least one added element from the group consisting of elements of Groups 2-14 of the long form of the periodic table (excluding silicon and carbon), the ratio (O/Si) of oxygen atoms to carbon atoms being 1.4-2.2, and the ratio (N/Si) of nitrogen atoms to carbon atoms being 0-0.4.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_CN105246683A
source esp@cenet
subjects AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G
APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
BASIC ELECTRIC ELEMENTS
CHEMISTRY
COMPOSITIONS BASED THEREON
ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
GENERAL PROCESSES OF COMPOUNDING
LAYERED PRODUCTS
LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
METALLURGY
ORGANIC MACROMOLECULAR COMPOUNDS
PERFORMING OPERATIONS
PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL
SEMICONDUCTOR DEVICES
SPRAYING OR ATOMISING IN GENERAL
THEIR PREPARATION OR CHEMICAL WORKING-UP
TRANSPORTING
WORKING-UP
title Gas-barrier film and process for producing the same
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T21%3A54%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ITO%20HIROHIDE&rft.date=2016-01-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN105246683A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true