System and method for automatically monitoring device faults

System and method for automatically monitoring device faults

The invention provides a system and method for automatically monitoring device faults. The system comprises a management unit and a modulation unit, wherein the management unit receives and collects the data of devices on a production line periodically, and determines whether faults occur in the dev...

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Hauptverfasser: BANG, HYUNJIN, JEON, HYEONJU, CHO, CHEOLHYUNG, KIM, KYUNGTAEK
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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creator BANG, HYUNJIN
JEON, HYEONJU
CHO, CHEOLHYUNG
KIM, KYUNGTAEK
description The invention provides a system and method for automatically monitoring device faults. The system comprises a management unit and a modulation unit, wherein the management unit receives and collects the data of devices on a production line periodically, and determines whether faults occur in the devices through analysis of the collected data; and if the modulation unit receives the information about the devices with detected faults from the management unit, the modulation of the devices with detected faults is redrawn and the redrawn modulation is transmitted to the devices.
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
title System and method for automatically monitoring device faults
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