Method for measuring plane mirror absolute surface shape based on conjugate difference method

The invention discloses a method for measuring plane mirror absolute surface shape based on a conjugate difference method. The method comprises the following steps: a plane mirror to be measured and a standard plane mirror forming interference images on a CCD of an interferometer respectively, judgi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CAI HUIJUAN, PAN LINKAI, GAO ZHISHAN, ZHU RIHONG, SUN WEIYUAN, MA JUN, LI JIANXIN
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CAI HUIJUAN
PAN LINKAI
GAO ZHISHAN
ZHU RIHONG
SUN WEIYUAN
MA JUN
LI JIANXIN
description The invention discloses a method for measuring plane mirror absolute surface shape based on a conjugate difference method. The method comprises the following steps: a plane mirror to be measured and a standard plane mirror forming interference images on a CCD of an interferometer respectively, judging the sizes of light spots of the plane mirror to be measured and the standard plane mirror formed on the CCD of the interferometer and enabling the light spot of the standard plane mirror to be larger than the light spot of the plane mirror to be measured; determining translation amount delta of the plane mirror to be measured corresponding to one pixel in the CCD of the interferometer, delta>0; defining the direction of optical axis of the interferometer as the z axis and carrying four-step test in the positive and negative directions of the x axis and y axis respectively and recording wavefront data phi (x+delta, y), phi (x-delta, y), phi (x, y+delta) and phi (x, y-delta) respectively; obtaining surface shape gradient of the plane mirror to be measured according to the measured wavefront data; and recovering the surface shape w of the plane mirror to be measured according to the surface shape gradient of the plane mirror to be measured by utilizing a wave surface recovering method. The method improves precision of differential approximation and prevents coupling between step-by-step tests, thereby improving stability of the test; and the method can also be used for measuring the absolute surface shape of a cylindrical mirror, a conical mirror and a spherical mirror.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104976962A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104976962A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104976962A3</originalsourceid><addsrcrecordid>eNqNjE0KwjAQRrNxIeodxgMI_lHpUoriRldupUybSRtJJiFJ7-8gHsDVg-97vLl63amMQYMJCTxhnpLlAaJDJvA2JZmxy8FNhUBOg71wxEjQYSYNgaEP_J4GFEFbYygRi-O_2aWaGXSZVj8u1Pp6eTa3DcXQUo5SYypt89htj_Wpqqv9-fCP8wESTzx7</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for measuring plane mirror absolute surface shape based on conjugate difference method</title><source>esp@cenet</source><creator>CAI HUIJUAN ; PAN LINKAI ; GAO ZHISHAN ; ZHU RIHONG ; SUN WEIYUAN ; MA JUN ; LI JIANXIN</creator><creatorcontrib>CAI HUIJUAN ; PAN LINKAI ; GAO ZHISHAN ; ZHU RIHONG ; SUN WEIYUAN ; MA JUN ; LI JIANXIN</creatorcontrib><description>The invention discloses a method for measuring plane mirror absolute surface shape based on a conjugate difference method. The method comprises the following steps: a plane mirror to be measured and a standard plane mirror forming interference images on a CCD of an interferometer respectively, judging the sizes of light spots of the plane mirror to be measured and the standard plane mirror formed on the CCD of the interferometer and enabling the light spot of the standard plane mirror to be larger than the light spot of the plane mirror to be measured; determining translation amount delta of the plane mirror to be measured corresponding to one pixel in the CCD of the interferometer, delta&gt;0; defining the direction of optical axis of the interferometer as the z axis and carrying four-step test in the positive and negative directions of the x axis and y axis respectively and recording wavefront data phi (x+delta, y), phi (x-delta, y), phi (x, y+delta) and phi (x, y-delta) respectively; obtaining surface shape gradient of the plane mirror to be measured according to the measured wavefront data; and recovering the surface shape w of the plane mirror to be measured according to the surface shape gradient of the plane mirror to be measured by utilizing a wave surface recovering method. The method improves precision of differential approximation and prevents coupling between step-by-step tests, thereby improving stability of the test; and the method can also be used for measuring the absolute surface shape of a cylindrical mirror, a conical mirror and a spherical mirror.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20151014&amp;DB=EPODOC&amp;CC=CN&amp;NR=104976962A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20151014&amp;DB=EPODOC&amp;CC=CN&amp;NR=104976962A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CAI HUIJUAN</creatorcontrib><creatorcontrib>PAN LINKAI</creatorcontrib><creatorcontrib>GAO ZHISHAN</creatorcontrib><creatorcontrib>ZHU RIHONG</creatorcontrib><creatorcontrib>SUN WEIYUAN</creatorcontrib><creatorcontrib>MA JUN</creatorcontrib><creatorcontrib>LI JIANXIN</creatorcontrib><title>Method for measuring plane mirror absolute surface shape based on conjugate difference method</title><description>The invention discloses a method for measuring plane mirror absolute surface shape based on a conjugate difference method. The method comprises the following steps: a plane mirror to be measured and a standard plane mirror forming interference images on a CCD of an interferometer respectively, judging the sizes of light spots of the plane mirror to be measured and the standard plane mirror formed on the CCD of the interferometer and enabling the light spot of the standard plane mirror to be larger than the light spot of the plane mirror to be measured; determining translation amount delta of the plane mirror to be measured corresponding to one pixel in the CCD of the interferometer, delta&gt;0; defining the direction of optical axis of the interferometer as the z axis and carrying four-step test in the positive and negative directions of the x axis and y axis respectively and recording wavefront data phi (x+delta, y), phi (x-delta, y), phi (x, y+delta) and phi (x, y-delta) respectively; obtaining surface shape gradient of the plane mirror to be measured according to the measured wavefront data; and recovering the surface shape w of the plane mirror to be measured according to the surface shape gradient of the plane mirror to be measured by utilizing a wave surface recovering method. The method improves precision of differential approximation and prevents coupling between step-by-step tests, thereby improving stability of the test; and the method can also be used for measuring the absolute surface shape of a cylindrical mirror, a conical mirror and a spherical mirror.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjE0KwjAQRrNxIeodxgMI_lHpUoriRldupUybSRtJJiFJ7-8gHsDVg-97vLl63amMQYMJCTxhnpLlAaJDJvA2JZmxy8FNhUBOg71wxEjQYSYNgaEP_J4GFEFbYygRi-O_2aWaGXSZVj8u1Pp6eTa3DcXQUo5SYypt89htj_Wpqqv9-fCP8wESTzx7</recordid><startdate>20151014</startdate><enddate>20151014</enddate><creator>CAI HUIJUAN</creator><creator>PAN LINKAI</creator><creator>GAO ZHISHAN</creator><creator>ZHU RIHONG</creator><creator>SUN WEIYUAN</creator><creator>MA JUN</creator><creator>LI JIANXIN</creator><scope>EVB</scope></search><sort><creationdate>20151014</creationdate><title>Method for measuring plane mirror absolute surface shape based on conjugate difference method</title><author>CAI HUIJUAN ; PAN LINKAI ; GAO ZHISHAN ; ZHU RIHONG ; SUN WEIYUAN ; MA JUN ; LI JIANXIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104976962A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CAI HUIJUAN</creatorcontrib><creatorcontrib>PAN LINKAI</creatorcontrib><creatorcontrib>GAO ZHISHAN</creatorcontrib><creatorcontrib>ZHU RIHONG</creatorcontrib><creatorcontrib>SUN WEIYUAN</creatorcontrib><creatorcontrib>MA JUN</creatorcontrib><creatorcontrib>LI JIANXIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CAI HUIJUAN</au><au>PAN LINKAI</au><au>GAO ZHISHAN</au><au>ZHU RIHONG</au><au>SUN WEIYUAN</au><au>MA JUN</au><au>LI JIANXIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for measuring plane mirror absolute surface shape based on conjugate difference method</title><date>2015-10-14</date><risdate>2015</risdate><abstract>The invention discloses a method for measuring plane mirror absolute surface shape based on a conjugate difference method. The method comprises the following steps: a plane mirror to be measured and a standard plane mirror forming interference images on a CCD of an interferometer respectively, judging the sizes of light spots of the plane mirror to be measured and the standard plane mirror formed on the CCD of the interferometer and enabling the light spot of the standard plane mirror to be larger than the light spot of the plane mirror to be measured; determining translation amount delta of the plane mirror to be measured corresponding to one pixel in the CCD of the interferometer, delta&gt;0; defining the direction of optical axis of the interferometer as the z axis and carrying four-step test in the positive and negative directions of the x axis and y axis respectively and recording wavefront data phi (x+delta, y), phi (x-delta, y), phi (x, y+delta) and phi (x, y-delta) respectively; obtaining surface shape gradient of the plane mirror to be measured according to the measured wavefront data; and recovering the surface shape w of the plane mirror to be measured according to the surface shape gradient of the plane mirror to be measured by utilizing a wave surface recovering method. The method improves precision of differential approximation and prevents coupling between step-by-step tests, thereby improving stability of the test; and the method can also be used for measuring the absolute surface shape of a cylindrical mirror, a conical mirror and a spherical mirror.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_CN104976962A
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Method for measuring plane mirror absolute surface shape based on conjugate difference method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T04%3A03%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CAI%20HUIJUAN&rft.date=2015-10-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN104976962A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true