Directive test system for assembling laser array
The invention discloses a directive test system for assembling a laser array, and relates to the technical field of photoelectric devices. The system comprises a semiconductor laser laminated array, a plurality of collimating lenses, an optical screen, and a light spot on-line monitoring system. The...
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creator | YAN LIHUA REN YONGXUE WANG YINGSHUN |
description | The invention discloses a directive test system for assembling a laser array, and relates to the technical field of photoelectric devices. The system comprises a semiconductor laser laminated array, a plurality of collimating lenses, an optical screen, and a light spot on-line monitoring system. The semiconductor laser laminated array is formed by lamination of chips of a semiconductor laser in the direction of a fast axis. Each chip corresponds to one collimating lens, and each collimating lens is arranged in an emitting light window of one corresponding chip. The optical screen is arranged to face the emitting light windows of the chips. Light beams that are gathered by the collimating lenses are irradiated on the optical screen to form light spots. The light spot on-line monitoring system includes a camera and a data processing computer connected with the camera. The system is capable of adjusting the position, rotation, pitching or the like of the collimating lenses, the light beam quality can be optimized during a light beam collimation process, and the light beam quality of a large-power semiconductor laser can be improved. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104966986A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104966986A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104966986A3</originalsourceid><addsrcrecordid>eNrjZDBwySxKTS7JLEtVKEktLlEoriwuSc1VSMsvUkgsLk7NTcrJzEtXyEksTgUKFBUlVvIwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0MDE0szM0sLM0djYtQAAHswK58</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Directive test system for assembling laser array</title><source>esp@cenet</source><creator>YAN LIHUA ; REN YONGXUE ; WANG YINGSHUN</creator><creatorcontrib>YAN LIHUA ; REN YONGXUE ; WANG YINGSHUN</creatorcontrib><description>The invention discloses a directive test system for assembling a laser array, and relates to the technical field of photoelectric devices. The system comprises a semiconductor laser laminated array, a plurality of collimating lenses, an optical screen, and a light spot on-line monitoring system. The semiconductor laser laminated array is formed by lamination of chips of a semiconductor laser in the direction of a fast axis. Each chip corresponds to one collimating lens, and each collimating lens is arranged in an emitting light window of one corresponding chip. The optical screen is arranged to face the emitting light windows of the chips. Light beams that are gathered by the collimating lenses are irradiated on the optical screen to form light spots. The light spot on-line monitoring system includes a camera and a data processing computer connected with the camera. The system is capable of adjusting the position, rotation, pitching or the like of the collimating lenses, the light beam quality can be optimized during a light beam collimation process, and the light beam quality of a large-power semiconductor laser can be improved.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; DEVICES USING STIMULATED EMISSION ; ELECTRICITY</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151007&DB=EPODOC&CC=CN&NR=104966986A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151007&DB=EPODOC&CC=CN&NR=104966986A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAN LIHUA</creatorcontrib><creatorcontrib>REN YONGXUE</creatorcontrib><creatorcontrib>WANG YINGSHUN</creatorcontrib><title>Directive test system for assembling laser array</title><description>The invention discloses a directive test system for assembling a laser array, and relates to the technical field of photoelectric devices. The system comprises a semiconductor laser laminated array, a plurality of collimating lenses, an optical screen, and a light spot on-line monitoring system. The semiconductor laser laminated array is formed by lamination of chips of a semiconductor laser in the direction of a fast axis. Each chip corresponds to one collimating lens, and each collimating lens is arranged in an emitting light window of one corresponding chip. The optical screen is arranged to face the emitting light windows of the chips. Light beams that are gathered by the collimating lenses are irradiated on the optical screen to form light spots. The light spot on-line monitoring system includes a camera and a data processing computer connected with the camera. The system is capable of adjusting the position, rotation, pitching or the like of the collimating lenses, the light beam quality can be optimized during a light beam collimation process, and the light beam quality of a large-power semiconductor laser can be improved.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DEVICES USING STIMULATED EMISSION</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBwySxKTS7JLEtVKEktLlEoriwuSc1VSMsvUkgsLk7NTcrJzEtXyEksTgUKFBUlVvIwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0MDE0szM0sLM0djYtQAAHswK58</recordid><startdate>20151007</startdate><enddate>20151007</enddate><creator>YAN LIHUA</creator><creator>REN YONGXUE</creator><creator>WANG YINGSHUN</creator><scope>EVB</scope></search><sort><creationdate>20151007</creationdate><title>Directive test system for assembling laser array</title><author>YAN LIHUA ; REN YONGXUE ; WANG YINGSHUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104966986A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DEVICES USING STIMULATED EMISSION</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>YAN LIHUA</creatorcontrib><creatorcontrib>REN YONGXUE</creatorcontrib><creatorcontrib>WANG YINGSHUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAN LIHUA</au><au>REN YONGXUE</au><au>WANG YINGSHUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Directive test system for assembling laser array</title><date>2015-10-07</date><risdate>2015</risdate><abstract>The invention discloses a directive test system for assembling a laser array, and relates to the technical field of photoelectric devices. The system comprises a semiconductor laser laminated array, a plurality of collimating lenses, an optical screen, and a light spot on-line monitoring system. The semiconductor laser laminated array is formed by lamination of chips of a semiconductor laser in the direction of a fast axis. Each chip corresponds to one collimating lens, and each collimating lens is arranged in an emitting light window of one corresponding chip. The optical screen is arranged to face the emitting light windows of the chips. Light beams that are gathered by the collimating lenses are irradiated on the optical screen to form light spots. The light spot on-line monitoring system includes a camera and a data processing computer connected with the camera. The system is capable of adjusting the position, rotation, pitching or the like of the collimating lenses, the light beam quality can be optimized during a light beam collimation process, and the light beam quality of a large-power semiconductor laser can be improved.</abstract><oa>free_for_read</oa></addata></record> |
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title | Directive test system for assembling laser array |
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