Preparation method of MTM antifuse

The invention relates to a preparation method of an MTM antifuse, belonging to the technical field of integrated circuits. The preparation method comprises that A) an intermetallic dielectric layer and a lower metal layer are successively deposited on a silicon substrate and a completed device layer...

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Hauptverfasser: XU HAIMING, TANG SAINAN, WANG YINQUAN, HONG GENSHEN, ZHENG LIANGCHEN, ZHENG RUOCHENG
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creator XU HAIMING
TANG SAINAN
WANG YINQUAN
HONG GENSHEN
ZHENG LIANGCHEN
ZHENG RUOCHENG
description The invention relates to a preparation method of an MTM antifuse, belonging to the technical field of integrated circuits. The preparation method comprises that A) an intermetallic dielectric layer and a lower metal layer are successively deposited on a silicon substrate and a completed device layer; B) a first barrier layer is deposited; C) an antifuse dielectric layer is deposited; D) SES technical processing is carried out on the antifuse dielectric layer to improve the non-crystallization degree of the antifuse dielectric layer; E) a second barrier layer is deposited; F) MTM antifuse lithography and corrosion are carried out to form an upper pole plate portion of an MTM antifuse structure; G) lithography and corrosion are carried out on the lower metal layer to form a lower pole plate portion of the MTM antifuse structure; and H) a second intermetallic dielectric layer and an upper metal layer are deposited, and lithography and corrosion are carried out on the upper metal layer, to form a complete structure of the MTM antifuse. The non-crystallization degree of the antifuse is greatly improved, and the breakdown consistency of the dielectric layers of the antifuse is improved.
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The preparation method comprises that A) an intermetallic dielectric layer and a lower metal layer are successively deposited on a silicon substrate and a completed device layer; B) a first barrier layer is deposited; C) an antifuse dielectric layer is deposited; D) SES technical processing is carried out on the antifuse dielectric layer to improve the non-crystallization degree of the antifuse dielectric layer; E) a second barrier layer is deposited; F) MTM antifuse lithography and corrosion are carried out to form an upper pole plate portion of an MTM antifuse structure; G) lithography and corrosion are carried out on the lower metal layer to form a lower pole plate portion of the MTM antifuse structure; and H) a second intermetallic dielectric layer and an upper metal layer are deposited, and lithography and corrosion are carried out on the upper metal layer, to form a complete structure of the MTM antifuse. 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The preparation method comprises that A) an intermetallic dielectric layer and a lower metal layer are successively deposited on a silicon substrate and a completed device layer; B) a first barrier layer is deposited; C) an antifuse dielectric layer is deposited; D) SES technical processing is carried out on the antifuse dielectric layer to improve the non-crystallization degree of the antifuse dielectric layer; E) a second barrier layer is deposited; F) MTM antifuse lithography and corrosion are carried out to form an upper pole plate portion of an MTM antifuse structure; G) lithography and corrosion are carried out on the lower metal layer to form a lower pole plate portion of the MTM antifuse structure; and H) a second intermetallic dielectric layer and an upper metal layer are deposited, and lithography and corrosion are carried out on the upper metal layer, to form a complete structure of the MTM antifuse. The non-crystallization degree of the antifuse is greatly improved, and the breakdown consistency of the dielectric layers of the antifuse is improved.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Preparation method of MTM antifuse
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