Linear shape measurement method and linear

The invention discloses a linear shape measurement method and linear shape measurement device. In the linear shape measurement method, three sensors which are arranged at intervals along a first direction is positioned oppositely to the object to be detected; the sensor collects the height data of t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	ICHIHARA KOICHI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention discloses a linear shape measurement method and linear shape measurement device. In the linear shape measurement method, three sensors which are arranged at intervals along a first direction is positioned oppositely to the object to be detected; the sensor collects the height data of the surface of the object to be measured with the sampling interval being under 1mm along the first direction. According to the collected height data, the curve rate of the sampling rate on the surface of the object to be measured is solved. According to the curve rate, the linear shape of the surface of the object to be measured is resolved.