Device for evaluating surface state of metal material, device for evaluating visibility of transparent substrate, evaluation program thereof, and computer-readable recording medium recording same

The present invention efficiently and accurately evaluates the surface state of a metal material. This device for evaluating the surface state of a metal material is provided with: an imaging means that pastes the surface of a metal material to at least one surface of a transparent substrate, then r...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ARAI HIDETA, ARAI KOHSUKE, NAKAMURO KAICHIRO, MIKI ATSUSHI
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING PHYSICS PRINTED CIRCUITS TESTING
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