Pulsed eddy current probe, testing device and testing method of testing device

The invention relates to a pulsed eddy current probe, a testing device and a testing method of the testing device, and belongs to pulsed eddy current nondestructive testing devices and testing methods of the devices. The pulsed eddy current probe, the testing device and the testing method of the testing device are used for solving the problem that the exciting coil of an existing pulsed eddy current probe generates heat, and therefore, the actual testing accuracy is influenced. The pulsed eddy current probe comprises a shell, a terminal stud, a temperature sensor assembly, a Hall sensor, a coil skeleton, an exciting coil and an end cover. The testing device comprises a signal generator, a power amplifier, a signal conditioning circuit, the pulsed eddy current probe, a data acquisition card, a main controller and a stabilized voltage supply. The testing method comprises the step of sensor calibration, the step of three-dimensional surface building and the step of measurement and calculation. The main controller acquires the temperature simulation signals of the temperature sensor assembly and the voltage stimulation signals of the Hall sensor in real time to carry out secondary correction on the output signals of the pulsed eddy current probe, therefore, the influence caused by temperature drift on the probe is greatly reduced, and the testing effect is improved.