Integrated Circuit Testing Interface on Automatic Test Equipment

An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin for receiving or transmitting at least a test signal to a tester of the automatic test equipment, a plurality of digitizers coupled to the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LEE TSUNG-JUN, CHEN CHUNI, LAI HUNG-WEI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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