Method and device for determining x-ray radiation attenuation caused by object to be examined

The invention relates to the use of the spectral composition of X-ray radiation in addition to the intensity thereof in order to determine the attenuation caused by an object (7). Another aspect of the invention is a device, particularly a radiation monitor (M) for an X-ray or CT system (1), which i...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	HANNEMANN THILO, REINWAND MARIO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The invention relates to the use of the spectral composition of X-ray radiation in addition to the intensity thereof in order to determine the attenuation caused by an object (7). Another aspect of the invention is a device, particularly a radiation monitor (M) for an X-ray or CT system (1), which is suitable for performing the aforementioned procedure according to the invention.