Building wall defect measurement method based on image and system thereof

The invention discloses a building wall defect measurement method based on an image and a system thereof. The method comprises the following steps: acquiring the image of a building wall surface, processing, displaying and computing and measuring the image; specifically, based on a to-be-measured pi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHANG XIAOHAO, YANG XIAOQI, SHI XIAOWEI, ZHENG PENGSHANG, ZHAO DAWEI, KONG HAIZHI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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