Sample analyzing system, sample analyzer, and management method of sample analyzing system

A sample analyzing system comprising: a first sample analyzer including a first measurement unit for measuring a sample and a first control unit for controlling the first measurement unit; and a second sample analyzer including a second measurement unit for measuring the sample and a second control...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YAO SYUNSUKE, NISHIDA TAISUKE, KUWAOKA SHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!