Built in self-testing and repair device and method

A memory device with background built-in self-testing (BBIST) includes a plurality of memory blocks; a memory buffer to offload data from one of the plurality of memory blocks temporarily; and a memory block stress controller to control a stress test applied to the one of the memory blocks when the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PATEL JAY, SIKDAR DIPAK K, KLEVELAND BENDIK, CHOPRA RAJESH
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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