Built in self-testing and repair device and method

Built in self-testing and repair device and method

A memory device with background built-in self-testing (BBIST) includes a plurality of memory blocks; a memory buffer to offload data from one of the plurality of memory blocks temporarily; and a memory block stress controller to control a stress test applied to the one of the memory blocks when the...

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Hauptverfasser: PATEL JAY, SIKDAR DIPAK K, KLEVELAND BENDIK, CHOPRA RAJESH
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator PATEL JAY
SIKDAR DIPAK K
KLEVELAND BENDIK
CHOPRA RAJESH
description A memory device with background built-in self-testing (BBIST) includes a plurality of memory blocks; a memory buffer to offload data from one of the plurality of memory blocks temporarily; and a memory block stress controller to control a stress test applied to the one of the memory blocks when the data is temporarily offloaded on the memory buffer. The stress test tests for errors in the one of the plurality of the memory blocks.
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PHYSICS
STATIC STORES
title Built in self-testing and repair device and method
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