Barrier coated nano structures
The present invention relates to a device comprising a nano-structure and a corresponding method of manufacturing, wherein said nano- structure is made of electrically conductive material and wherein said nano- structure is covered by a barrier coating comprising Ti, Zr, Hf, Nb, Ta, Mo, Sc, Y, Ge, L...
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| creator | VAN DEN HEUVEL CORNELIUS ANTONIUS WIMBERGER-FRIEDL REINHOLD DE WITZ CHRISTIANNE ROSSETTE MARIA |
| description | The present invention relates to a device comprising a nano-structure and a corresponding method of manufacturing, wherein said nano- structure is made of electrically conductive material and wherein said nano- structure is covered by a barrier coating comprising Ti, Zr, Hf, Nb, Ta, Mo, Sc, Y, Ge, La, Ce, Pr, Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu, Sr, Al, B, Ba, Bi, and/or Mg oxide in a thickness of at least about 1 nm, wherein said barrier coating is deposited by atomic layer deposition (ALD). The present invention also relates to a method of detecting a target compound in such a device, the use of such a device for surface specifically creating an evanescent field, measuring the dielectric properties of a medium, detecting the presence or the concentration of a target compound, determining the primary structure of a target compound, determining a deviation of the target compound from a control value, amplifying a target compound, or monitoring the amplification of a target compound. |
| format | Patent |
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The present invention also relates to a method of detecting a target compound in such a device, the use of such a device for surface specifically creating an evanescent field, measuring the dielectric properties of a medium, detecting the presence or the concentration of a target compound, determining the primary structure of a target compound, determining a deviation of the target compound from a control value, amplifying a target compound, or monitoring the amplification of a target compound.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; MEASURING ; NANOTECHNOLOGY ; PERFORMING OPERATIONS ; PHYSICS ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TESTING ; TRANSPORTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150311&DB=EPODOC&CC=CN&NR=104412096A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150311&DB=EPODOC&CC=CN&NR=104412096A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VAN DEN HEUVEL CORNELIUS ANTONIUS</creatorcontrib><creatorcontrib>WIMBERGER-FRIEDL REINHOLD</creatorcontrib><creatorcontrib>DE WITZ CHRISTIANNE ROSSETTE MARIA</creatorcontrib><title>Barrier coated nano structures</title><description>The present invention relates to a device comprising a nano-structure and a corresponding method of manufacturing, wherein said nano- structure is made of electrically conductive material and wherein said nano- structure is covered by a barrier coating comprising Ti, Zr, Hf, Nb, Ta, Mo, Sc, Y, Ge, La, Ce, Pr, Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu, Sr, Al, B, Ba, Bi, and/or Mg oxide in a thickness of at least about 1 nm, wherein said barrier coating is deposited by atomic layer deposition (ALD). The present invention also relates to a method of detecting a target compound in such a device, the use of such a device for surface specifically creating an evanescent field, measuring the dielectric properties of a medium, detecting the presence or the concentration of a target compound, determining the primary structure of a target compound, determining a deviation of the target compound from a control value, amplifying a target compound, or monitoring the amplification of a target compound.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>MEASURING</subject><subject>NANOTECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBzSiwqykwtUkjOTyxJTVHIS8zLVyguKSpNLiktSi3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GBiYmhkYGlmaOxsSoAQAFYiSi</recordid><startdate>20150311</startdate><enddate>20150311</enddate><creator>VAN DEN HEUVEL CORNELIUS ANTONIUS</creator><creator>WIMBERGER-FRIEDL REINHOLD</creator><creator>DE WITZ CHRISTIANNE ROSSETTE MARIA</creator><scope>EVB</scope></search><sort><creationdate>20150311</creationdate><title>Barrier coated nano structures</title><author>VAN DEN HEUVEL CORNELIUS ANTONIUS ; WIMBERGER-FRIEDL REINHOLD ; DE WITZ CHRISTIANNE ROSSETTE MARIA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104412096A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>MEASURING</topic><topic>NANOTECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>VAN DEN HEUVEL CORNELIUS ANTONIUS</creatorcontrib><creatorcontrib>WIMBERGER-FRIEDL REINHOLD</creatorcontrib><creatorcontrib>DE WITZ CHRISTIANNE ROSSETTE MARIA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VAN DEN HEUVEL CORNELIUS ANTONIUS</au><au>WIMBERGER-FRIEDL REINHOLD</au><au>DE WITZ CHRISTIANNE ROSSETTE MARIA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Barrier coated nano structures</title><date>2015-03-11</date><risdate>2015</risdate><abstract>The present invention relates to a device comprising a nano-structure and a corresponding method of manufacturing, wherein said nano- structure is made of electrically conductive material and wherein said nano- structure is covered by a barrier coating comprising Ti, Zr, Hf, Nb, Ta, Mo, Sc, Y, Ge, La, Ce, Pr, Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu, Sr, Al, B, Ba, Bi, and/or Mg oxide in a thickness of at least about 1 nm, wherein said barrier coating is deposited by atomic layer deposition (ALD). The present invention also relates to a method of detecting a target compound in such a device, the use of such a device for surface specifically creating an evanescent field, measuring the dielectric properties of a medium, detecting the presence or the concentration of a target compound, determining the primary structure of a target compound, determining a deviation of the target compound from a control value, amplifying a target compound, or monitoring the amplification of a target compound.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TESTING TRANSPORTING |
| title | Barrier coated nano structures |
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